Hostname: page-component-78c5997874-s2hrs Total loading time: 0 Render date: 2024-11-05T16:45:40.906Z Has data issue: false hasContentIssue false
  • English
  • Français

X-Ray Fluorescence Analysis at Room Temperature with an Energy Dispersive Mercuric Iodide Spectrometer1.

Published online by Cambridge University Press:  06 March 2019

M. Singh ,
A.J. Dabrowski ,
G.C. Huth ,
J.S. Iwanczyk ,
B.C. Clark  and
A.K. Baird
M. Singh
Affiliation:
University of Southern Calif., Medical Imaging Science Group, 4676 Admiralty Way, Marina Del Rey, CA 90291
A.J. Dabrowski
Affiliation:
University of Southern Calif., Medical Imaging Science Group, 4676 Admiralty Way, Marina Del Rey, CA 90291
G.C. Huth
Affiliation:
University of Southern Calif., Medical Imaging Science Group, 4676 Admiralty Way, Marina Del Rey, CA 90291
J.S. Iwanczyk
Affiliation:
University of Southern Calif., Medical Imaging Science Group, 4676 Admiralty Way, Marina Del Rey, CA 90291
B.C. Clark
Affiliation:
Martin-Marietta Corporation, Denver, Colorado 80201
A.K. Baird
Affiliation:
Department of Geology, Pomona College, Claremont, California 91711
Get access

Extract

We have previously reported on the uniqueness and potential of room-temperature spectrometry of low-energy x-rays with a mercuric iodide (HgI2) detector (1,2,3). In this paper we emphasize the use of HgI2 detectors for x-ray fluorescence (XRF) analysis.

Because no vacuum plumbing or cryogenic cooling is required, the design of a mercuric iodide room-temperature x-ray spectrometer is extremely simple. Our present design consists of coupling a detector directly to the first-stage FET in a modified Tennelec 161 D preamplifier and making the configuration “light-tight”. Aside from providing a suitable entrance window, there are no other requirements for routine spectroscopy.

Type
XRF: Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 23: Twenty-Eighth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1979 , 1979 , pp. 249 - 256
Copyright
Copyright © International Centre for Diffraction Data 1979

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Footnotes

2.

On leave from Institute of Nuclear Research, Swierk, Poland.

1.

Research supported by Department of Energy funding under Contract DE-AS03-76-SF00113.

References

1. Dabrowski, A.J., Huth, G.C., Singh, M. et al: Appl. Phys. Lett. 33 (2), 211–213 (1978)Google Scholar
2. Huth, G.C., Dabrowski, A.J., Singh, M. et al: Adv. in X-ray Analysis, 22, 461–472 (1978)Google Scholar
3. Dabrowski, A.J., Singh, M., Huth, G.C., Iwanczyk, J.S.: Invited Paper, NBS Workshop on Energy Dispersive X-ray Spectrometry, Gaithersburg, Maryland, Aug, 23-25, 1979(In Press)Google Scholar
4. Dabrowski, A.J., Huth, G.C.: IEEE Trans. Nucl. Sci. NS-25 (1), 205211 (1978)Google Scholar
5. Goulding, F.S., Jaklevic, J.M.: LBL-5367 (1976)Google Scholar
6. Goulding, F.S., Jaklevic, J.M.: UCRL-20625 (1971)Google Scholar