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X-ray Examination of Fracture Surfaces of Silicon Nitride Ceramics

Published online by Cambridge University Press:  06 March 2019

Zenjiro Yajima ,
Yukio Hirose  and
Keisuke Tanaka
Zenjiro Yajima
Affiliation:
Department of Mechanical Engineering, Kanazawa Institute of Technology, 7-1 Oogigaoka, Nonoichi, Kanazawa 921, Japan
Yukio Hirose
Affiliation:
Department of Material Science, Kanazawa University 1-1 Marunouchi, Kanazawa 920, Japan
Keisuke Tanaka
Affiliation:
Department of Engineering Science, Kyoto University Yoshida-hommachi, Sakyo-ku, Kyoto 606, Japan
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Extract

The residual stress left on the fracture surface is one of the important parameters in X-ray fractography. It has been used to analyze fracture mechanisms in fracture toughness and fatigue tests especially of iron and steels.

In the present paper, X-ray fractography was applied to the brittle fracture surface of a silicon nitride ceramics. The first part deals with the determination of the stress constant for diffraction from Si3N4(411) plane by Cr-Kα radiation. The second part describes the effect of the notch-tip radius on the fracture toughness value. In the last part, the plastic zone depth was determined from the residual stress destribution beneath the fracture surface.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 319 - 326
Copyright
Copyright © International Centre for Diffraction Data 1989

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References

1. Yajima, Z., Hirose, Y., and Tanaka, K., “X-Ray Fractography of Fatigue Fracture of Low-Alloy Steel in Air and in 3.5% NaCl Solution,“ J. Soci. Mat. Sci. Jap., 35: 725 (1986).Google Scholar
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