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X-Ray Double-Crystal Method of Analyzing Microstrains with BeO Single Crystals

Published online by Cambridge University Press:  06 March 2019

Jun-ichi Chikawa  and
Stanley B. Austerman
Jun-ichi Chikawa
Affiliation:
University of Denver Denver, Colorado
Stanley B. Austerman
Affiliation:
Autonetics Anaheim, California
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Abstract

A double.crystal arrangement was employed in the symmetrical Laue arrangement [(+n, −n) setting]. A perfect BeO crystal was used for the first crystal of the double-crystal spectrometer. To obtain a high X-ray intensity, the thickness of the crystal was made to correspond to a maximum of Pendellosung interference. A slit was pieced between the first and second (specimen) crystals to select the X-rays which precisely satisfy the Bragg condition. The slit was adjusted to avoid significant Fraunhofer diffraction. In this method, the incident beam for the specimen crystal was parallel enough to obtain intrinsic rocking curves of the specimen crystal. As an application, the method was used for determination of the senses of slight strains in BeO crystals.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 11: Sixteenth Annual Conference on Applications of X-ray Analysis, August 9-11, 1967 , 1967 , pp. 394 - 400
Copyright
Copyright © International Centre for Diffraction Data 1967

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References

1. Newkirk, J. B. and Wernick, J. H. (eds.), Direct Observation of Imperfections in Crystals, Interscience Publishers, Inc., New York, 1962.Google Scholar
2. Kato, N., “Wave Optical Theory of Diffraction in Single Crystals,” in: G. N. Ramachandran (ed.), Crystallography and Crystal Perfection, Academic Press, London, 1963, p. 153.Google Scholar
3. Authier, A., “Contrast of Dislocation Images in X-Ray Transmission Topography,” in: J. B. Newkirk and G. R. Mallett (eds.), Advances in X-Ray Analysis, Vol. 10, Plenum Press, New York, 1967, p. 9.Google Scholar
4. Authier, A., “Mise en evidence experimentate de la double refraction des rayons X,” Compt. Rend. 251: 2003, 1960.Google Scholar
5. Kato, N., “The Flow of X-Ray and Material Waves in Ideally Perfect Single Crystals,” Acta Cryst. 11: 885, 1958; also, P. P. Ewald, “Group Velocity in X-Ray Crystal Optics,” Acta Cryst. 11: 888, 1958.Google Scholar
6. James, R. W., “The Dynamical Theory of X-Ray Diffraction,” in: F. Seitz and D. Turnbull (eds.), Solid State Physics, Vol. 15, Academic Press, New York, 1963, pp. 55–220.Google Scholar
7. Born, M. and Wolf, E., Principles of Optics, Pergamon Press, London, 1964, p. 393.Google Scholar
8. Kato, N. and Lang, A. R., “A Study of Pendellösung Fringes in X-Ray Diffraction,” Acta Cryst. 12: 787, 1959; also, N. Kato, “A Theoretical Study of Pendellösung Fringes, Part I, General Considerations,” Acta Cryst. 14: 526, 1961; and N. Kato, “A Theoretical Study of Pendellösung Fringes, Part II, Detailed Discussion Based on a Spherical Wave Theory,” Acta Cryst. 14: 627, 1961.Google Scholar
9. Austerman, S. B., “Growth and Properties of Beryllium Oxide Single Crystals,” J. Nucl. Mater. 14: 225–236, 1964.Google Scholar
10. Penning, P. and Polder, D., “Anomalous Transmission of X-Rays in Elastically Deformed Crystals,” Philips Res. Rept. 16: 419, 1961.Google Scholar
11. Austerman, S. B., Newkirk, J. B., and Smith, D. K., “Study of Defect Structures in BeO Single Crystals by X-Ray Diffraction Topography,” J. Appl. Phys. 36: 3815, 1965.Google Scholar
12. Kato, N., “Pendellösung Fringes in Distorted Crystals,” J. Phys. Soc. Japan 19: 971, 1964 ; also, M. Hart, “Pendellösung Fringes in Elastically Deformed Silicon,” Z. Physik 189: 269, 1966.Google Scholar