Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-27T04:49:42.742Z Has data issue: false hasContentIssue false

Why The Fundamental Algorithm is So Fundamental

Published online by Cambridge University Press:  06 March 2019

Richard M. Rousseau*
Affiliation:
Geological Survey of Canada 601 Booth St., Ottawa, Ont., K1A 0E8, CANADA
Get access

Extract

In X-ray fluorescence (XRF) analysis, one of the major problems is the correction for matrix effects (absorption and enhancement). One of the solutions proposed was the use of influence coefficients, which are numerical coefficients that correct for the effect of each matrix element on the analyte. For many years, these coefficients were considered as an empirical approach having little connection with X-ray fluorescence theory. They were considered useful only when no other alternative was available to solve the problem of matrix effect.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Criss, J.W. and Birks, L.S., Anal. Chem., 40, 1080, (1968).Google Scholar
2. Sherman, J., Spectrochim. Acta, 7, 283, (1955).Google Scholar
3. Rousseau, R., X-Ray Spectrometry, 13, 115, (1984).Google Scholar
4. Lachance, G.R. and Traill, R.J., Can. Jour, of Spectrosc., 11, 43, (1966).Google Scholar
5. Rousseau, R.M. and Claisse, F., X-Ray Spectrometry, 3, 31, (1974).Google Scholar
6. Claisse, F. and Quintin, M., Can. Jour, of Spectrosc, 12, 129, (1967).Google Scholar
7. Rousseau, R., X-Ray Spectrometry, 13, 121, (1984).Google Scholar
8. Rousseau, R.M., Advances in X-Ray Analysis, 32, 69, (1989).Google Scholar
9. Rousseau, R.M. and Bouchard, M., X-Ray Spectrometry, 15, 207, (1986).Google Scholar
10. Rousseau, R.M., GAC-MAC Annual Meeting, McGill University, Montreal, Canada, 7, 141,(1989).Google Scholar
11. Rousseáu, R. M., Advances in X-Ray Analysis, 34, 157, (1991).Google Scholar