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A Versatile 19-cm-Diameter Low-Temperature Debye-Scherrer Camera

Published online by Cambridge University Press:  06 March 2019

A. Taylor
A. Taylor*
Affiliation:
Westinghouse Research Laboratory, Pittsburgh, Pennsylvania
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Abstract

The camera was constructed to fill the need for a low-temperature instrument capable of yielding high spectral resolution and accurate lattice parameters. Specimen temperatures in the range -190 to 300°C are attainable.

A special feature of the camera is the film holder which is split along the beam axis into two symmetrical halves and which can easily be removed from the base without disturbing the cooling system or the specimen. The specimenholderis mounted on a cross-slide to enable specimens of large radius to be rotated off-center with the beam at glancing incidence to their surface. Finally, diffraction patterns from large metallurgical samples may be obtained by removing one of the film holders and employing the apparatus as a “half camera.”

Some applications of the camera to the thermal expansion of SiC and MnSe are described.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 3: Eighth Annual Conference on Applications of X-ray Analysis, August 12-14, 1959 , 1959 , pp. 41 - 47
Copyright
Copyright © International Centre for Diffraction Data 1959

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References

1 Kaufmann, H. S. and Fankuchen, I., Rev. Sci. Instr., Vol. 20, 1949, p. 733.Google Scholar
2 Post, B., Schwartz, R. S., and Fankuchen, I., Rev. Sci. Instr., Vol. 22, 1951, p. 218.Google Scholar
3 Taylor, A. and Jones, R. M., Symposium on Silicon Carbide, Pergamon Press, Boston, 1959.Google Scholar
4 Kelly, K. K., J. Am. Chem. Soc, Vol. 61, 1939, p. 203.Google Scholar
5 Lindsay, R., Phys. Rev., Vol. 84, 1951, p. 569.Google Scholar