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The Use of Polarized X-Rays for Improved Detection Limits in Energy Dispersive X-Ray Spectrometry*.

Published online by Cambridge University Press:  06 March 2019

Richard W. Ryon ,
John D. Zahrt ,
Peter Wobrauschek  and
Hannes Aiginger
Richard W. Ryon
Affiliation:
Lawrence Livermore National Laboratory P.O. Box 808, L-310 Livermore, California 94550
John D. Zahrt
Affiliation:
University of Northern Arizona Flagstaff, Arizona
Peter Wobrauschek
Affiliation:
Atomic Institute of the Austrian Universities Vienna, Austria
Hannes Aiginger
Affiliation:
Atomic Institute of the Austrian Universities Vienna, Austria
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Abstract

The use of polarized x-rays to excite fluorescence spectra with decreased backgrounds and improved detection limits is reaching a mature state of development. With bulk, low-Z specimens, polarized x-ray sources have produced detection limits which are ~℩ to 3 times lower than are obtained with the best unpolarized photon sources. Based upon experience and the known properties of larger solid angle geometries, further significant to dramatic improvements are anticipated.

Type
II. XRF Methods: Practical, Mathematical
Information
Advances in X-Ray Analysis , Volume 25: Thirtieth Annual Conference on Applications of X-ray Analysis, August 3-7, 1981 , 1981 , pp. 63 - 74
Copyright
Copyright © International Centre for Diffraction Data 1981

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Footnotes

*

Work performed under the auspices of the U.S. Department of Energy by the Lawrence Livermore National Laboratory under contract number W-7405-ENG-48.

References

1. Dzubay, T. G., Jarrett, B. V., and Oaklevic, J. M., “Background Reduction in X-Ray Fluorescence Spectra Using Polarization,” Nuclear Instruments and Methods 115, pp. 197–299 (1974).Google Scholar
2. Aiginger, H., Wobrauschek, P., and Brauner, C., “Energy Dispersive Fluorescence Analysis using Bragg-Reflected Polarized X-Rays,” in “Measurement, Detection, and Control of Environmental Pollutants,” International Atomic Energy Agency, Vienna, pp. 197–212 (1976).Google Scholar
3. Young, J. C., Vane, R. A., and Lenehan, J. P., “Background Reduction by Polarization in Energy Dispersive X-Ray Spectrometry,” Western Regional Meeting of the American Chemical Society, San Diego, California (Oct. 1973).Google Scholar
4. Howell, R. H., Pickles, W. L., and Cate, J. L., Jr., “X-ray Fluorescence Experiments with Polarized X-Rays,” Advances in X-Ray Analysis 18, 265–77 (1974).Google Scholar
5. Kaufman, L. and Camp, D. C., “Polarized Radiation for X-Ray Fluorescence Analysis,” ibid, pp. 247–58.Google Scholar
6. Ryon, R. W., “Polarized Radiation Produced by Scatter for Energy Dispersive X-Ray Fluorescence Trace Analysis,” Advances in X-Ray Analysis 20, pp. 575–90 (1977).Google Scholar
7. Kaufman, L., Price, D. C., Holliday, M. A., Payne, B., Camp, D. C., Nelson, J. A., Deconninck, F., “Fluorescent Excitation Analysis in Medicine,” J. Radioanalytical Chemistry, 43, pp. 321–46 (1978).Google Scholar
8. Ong, P. S. and Randall, J. N., “A Focusing X-Ray Polarizer for Energy-Dispersive Analysis,” X-Ray Spectrometry, Vol. 7(4), pp. 241–8 (1978).Google Scholar
9. Ryon, R. W. and Zahrt, J. D., “Improved X-Ray Fluorescence Capabilities by Excitation with High Intensity Polarized X-Rays,” Advances in X-Ray Analysis 22, pp. 453–460 (1979).Google Scholar
10. Zahrt, J. D. and Ryon, R. W., “Multiple Scattering and the Polarization of X-Rays,” Advances in X-Ray Analysis 24, pp. 345–50 (1981).Google Scholar
11. Aiginger, H. and Wobrauschek, P., “X-Ray Fluorescence Analysis in the Nanogram Region with a Totally Reflected and a Bragg Polarized Primary Beam,” Journal of Radioanalytical Chemistry 61 (1-2), pp. 281–293 (1981).Google Scholar
12. Strittmatter, R. B., “X-Ray Fluorescance of Intermediate to High Atomic Number Elements Using Polarized X-Rays,” Thirtieth Annual Denver X-Ray Conference (August 1981). To be published in Advances in X-Ray Analysis, Vol. 25.Google Scholar
13. Barkla, C. G., “Polarisation in Secondary Rontgen Radiation,” Proceedings of the Royal Society (London), A77, pp. 247–255 (1906).Google Scholar
14. Howell, R. H. and Pickles, W. L., “Possible Sources of Polarized X-Rays for X-Ray Fluorescence Spectra with Reduced Backgrounds,” Nuclear Instruments and Methods, 120, pp. 187–188 (1974).Google Scholar
15. Sparks, C. J., Jr., “X-Ray Fluorescence Microprobe for Chemical Analysis,” in “Synchrotron Radiation Research,” Winich, Herman and Doniach, S., eds., pp. 459–512, Plenum Publishing Corp. (1980).Google Scholar
16. Alguard, M. J., Swent, R. L., Pantell, R. H., Berman, B. L. and Bloom, S. D., “Observation of Radiation from Channeled Positrons,” Physical Review Letters, 42(17), pp. 1148–51 (23 April 1979).Google Scholar
17. Fisher, R. A., “Possibility of a Distributed-feedback X-Ray Laser,” Applied Physics Letters, 24(12) pp. 598–599 (15 June 1974).Google Scholar
18. Akhmanov, S. A. and Grishanin, B. A., “Coherent Emission of Characteristic Lines on Passage of Charged Particles through a Single Crystal,” JETP Letters 23(10, pp. 515–8 (20 May 1976).Google Scholar
19. Das Gupta, K., “Observation of Non-Divergent X-Ray Beam from Germanium Mono-Crystal,” submitted for publication (June 1981).Google Scholar
20. Blok, M. A. in, “The Physics of X-Rays,” Second revised edition, Moscow, 1957. nglish translation from U.S. Atomic Energy Commission Office of Technical Information, AEC-tr-4502, p. 247.Google Scholar
21. Bertin, E. P., “Principles & Practice of X-Ray Spectrometric Analysis,” 2nd edition, Plenum Press, N.Y. 1975, p. 204.Google Scholar