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The Use Of Multilayer Structures in the Energy Dispersive X-Ray Fluorescence Analysis of Low Z Elements

Published online by Cambridge University Press:  06 March 2019

Birgit Kanngieβer ,
Burkbard Qeckhoff ,
Jens Scheer ,
Walter Swoboda  and
Jens Laursen
Birgit Kanngieβer
Affiliation:
University of Bremen, Department of Physics: P.O. 330 440 D-28334 Bremen, Germany
Burkbard Qeckhoff
Affiliation:
University of Bremen, Department of Physics: P.O. 330 440 D-28334 Bremen, Germany
Jens Scheer
Affiliation:
University of Bremen, Department of Physics: P.O. 330 440 D-28334 Bremen, Germany
Walter Swoboda
Affiliation:
University of Bremen, Department of Physics: P.O. 330 440 D-28334 Bremen, Germany
Jens Laursen
Affiliation:
Royal Veterinary and Agricultural University Department of Mathematics and Physics DK-1871 Frederiksberg C, Denmark
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Abstract

A toroidal focLising W/Si multilayer and a planar W/Si multilayer were tested for the possible usefulness for the Energy Dispersive X-Ray Fluorescence Analysis (EDXXRF) of low Z elements.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 535 - 544
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

1. Nicolosi, J.A., Groven, J.P., Merlo, D., “The use of Layered Synthetic Microstructures for quantitative analysis of elements: boron to magnesium”. Advances in X-Ray Analysis 30:183–192 (1986).Google Scholar
2. Eenhergen, A.V., Volbert, B., “Layered Synthetic Microstructures in sequential and simultaneous X-Ray Spectrometry”. Advances in X-Ray Analysis 30:201–211 (1986).Google Scholar
3. Marshall, G.F., “Monochromatization by Multilayered Optics on a Cylindrical Reflector and on an Ellipsoidal Focusing Ring”, Optical Engineering, Vol. 25, No. 8 (1986).Google Scholar
4. Marshall, G.J., “A unified geometrical insight for the design of toroidal reflectors with multilayered optical coatings: figured x-ray optics”, Applications of Thin-Film Multilayered Structures to Figured X-Ray Optics, G. F. Marshall, ed., Proc SPIE 563:114–134 (1985).Google Scholar