Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-19T13:12:05.932Z Has data issue: false hasContentIssue false

The Use of Computer Techniques to Plot Pole Figures

Published online by Cambridge University Press:  06 March 2019

J. H. Holland
Affiliation:
Wright Air Development Division, Dayton, Ohio
N. Engler
Affiliation:
University of Dayton, Dayton, Ohio
W. Powers
Affiliation:
University of Dayton, Dayton, Ohio
Get access

Abstract

A method has been derived and is currently being used to plot normalized pole figures by computer techniques. As the pole distribution traces, i.e., intensity of the diffracted X-ray beam, versus angular position of the specimen are not an acceptable input for the computer, the data required from such traces are entered onto IBM punch cards. Corrections for defocusing effects may be readily made as the data are transferred from the Brown recorder traces to IBM punch cards. It is possible to program other correction factors into the computer operations providing that these correction factors or curves can be established accurately. The computer translates angular position of the specimen into reactiiinear coordinates which are an identical representation of stereographic coordinates. This computer method has been used in conjunction with the Schulz reflection technique, but modification of the computer program permits its use with other quantitative X-ray techniques for determining preferred orientation.

The feasibility of using computer techniques to plot inverse pole figures has been considered.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1960

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Geisler, A. H., “Crystal Orientation and Pole Figure Determination,” Modem Research Techniques in Physical Metallurgy, ASM, Cleveland, 1953, pp, 131-153.Google Scholar
2. Schulz, L. G., “A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray Spectrometer,” J. Appl. Phys., Vol. 20, 1949, pp. 10301033.Google Scholar
3. Chernock, W. P. and Beck, P. A., “Analysis of Certain Errors in the X-Ray Reflection Method for the Quantitative Determination of Preferred Orientations, ” J. Appl. Phys., Vol. 23, 1952, pp. 341345.Google Scholar