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The Use of an X-Ray Fluorescence Semi-Microprobe Attachment in Metallurgy

Published online by Cambridge University Press:  06 March 2019

W. J. Wittig
W. J. Wittig*
Affiliation:
Union Carbide Corporation Kokomo, Indiana
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Abstract

Standard X-ray fluorescence spectrogmphs are capable of measuring elements in areas as small as ⅛-in. diameter, while an electron mitroprobe specialises in areas less than 10 μ. Frequently, a sample of an intermediate size (0.1 mm to 2 mm) requires analysis, so an attachment was designed for Philips Electronics Company equipment. Reasons for its design, sensitivity of the system, and several metallurgical examples showing its versatility are discussed in the report.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 8: Thirteenth Annual Conference on Applications of X-ray Analysis, August 12-14, 1964 , 1964 , pp. 248 - 258
Copyright
Copyright © International Centre for Diffraction Data 1964

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References

1. Heinrich, K. F. J., “X-Ray Probe with ColUmation of the Secondary Beam,” Advances in X-Ray Analysis, Vol. 5, William M. Mueller (éd.), University of Denver, Plenum Press, New York, 1962, pp. 516–526.Google Scholar
2. Sloan, R. D., “The X-Ray Spectre graphic Analysis of Thin Films by the Milliprobe Technique,” Advances in X-Ray Analysis, Vol. 5, William M. Mueller (ed.), University of Denver, Plenum Press, New York, 1962, 512–515.Google Scholar
3. Bertin, E. P., “Evaluation and Application of an Improved Slit Probe for the X-Ray Secondary .Emission Spectrometer,” Advances in X-Ray Analysis, Vol. 8, William M. Mueller, Gavin R. Mallett, and Marie J. Fay (eds.), University of Denver, Plenum Press, New York, 1965, pp. 231–247.Google Scholar