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The Use and Accuracy of Continuously Scanning Position-Sensitive Detector Data in X-Ray Powder Diffraction

Published online by Cambridge University Press:  06 March 2019

Herbert E. Göbel
Herbert E. Göbel*
Affiliation:
Forschungslaboratorien der SIEMENS AG, D 8000 München 83, West Germany
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Abstract

By collecting the diffracted X-rays in a focussing powder diffractometer with a linear position-sensitive detector (PSD), the data accumulation time can be widely reduced. Due to the focussing properties of the geometrical arrangement good resolution can be simultaneously achieved over a few degrees of the diffraction angle 2 Theta. The full pattern is collected by scanning the PSD along the entire 2 Theta arc. Scanning speeds of several hundred degrees per minute are possible and still yield well plotted diagrams.

This work demonstrates the performance of the system in different tasks of X-ray powder diffraction such as identification of unknown materials, quantitative analysis, determination of lattice constants and microcrystalline properties. The results, evaluated by parts of the program system DIFFRAC 11, show that the accuracy and resolution of the continuously scanning PSD technique match these tasks without difficulty and reach the precision limits of powder diffractometry itself. It is demonstrated that the data collection velocity, which matches well the data evaluation times, is not the only advantage compared to conventional diffractometets.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 24: Twenty-Ninth Annual Conference on Applications of X-ray Analysis, August 4-8, 1980 , 1980 , pp. 123 - 138
Copyright
Copyright © International Centre for Diffraction Data 1980

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References

1. Gobel, H. E., A New Method for Fast XRPD Using a Position Sensitive Detector, in: “Advances in X-Ray Analysis, Vol. 22,” McCarthy, G. J., Barrett, C. S., Leyden, D. E., Wewkirk, J. B., and Ruud, C. O., eds., Plenum Publishing Corp., New York (1979)Google Scholar
2. Gobel, H. E., ACA Winter Meeting (March 1979), Honolulu, HawaiiGoogle Scholar
3. Gobel, H. E., Ger. Offen. 2,637,945 (March 1979)Google Scholar
4. Appleman, D., ACA Meeting 1963, Cambridge, Mass. Program modified for PDF 11 by Johnson, G. G., Power, G., Stern, S. E. and Jobst, Barbara A. (1979).Google Scholar
5. Warren, B. E., Averbach, R. L., J. Appl, Phys. 21:595 (1950) and J. Appl. Phys. 23:497 (1952).Google Scholar
6. Broil, N., Henne, M., Kreutz, W., Analytical Application Note 271 (1979), Order No. E 689/2021 from Siemens AG, Karlsruhe, W. Germany.Google Scholar
7. Johnson, G. G. and Vand, V., Ind. Eng. Chem. 59:19–31 (1967).Google Scholar
8. Gobel, H. E., Ger. Offen. P 2833078.1 (1979).Google Scholar
9. James, M. R. and Cohen, J. B., J. Appl. Cryst. 12:339–345 (1979).Google Scholar
10. DIFFRAC 11, Software System for XRPD (1979/80) developed at Alfred University (Alfred, NY), Siemens Research Laboratories (Munich, W-Germany) and Siemens Corporation (Cherry Hill, N.J.) in contact with the JCPDS.Google Scholar
11. Marquardt, D. W., J. SIAM 11:431–441 (1963).Google Scholar