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The Universal Vacuum Spectrograph and Comparative Data on the Intensities Observed in an Air, Helium, and Vacuum Path

Published online by Cambridge University Press:  06 March 2019

D. C. Miller  and
P. William Zingaro
D. C. Miller
Affiliation:
Philips Electronics, Inc., Mount Vernon, New York
P. William Zingaro
Affiliation:
Philips Electronics, Inc., Mount Vernon, New York
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Abstract

Equipment is described whereby comparative measurements were made on the relative absorption of air.helium, and vacuum for the softer radiations which are of interest in furthering the range of sensitivities of the X-ray spectrograph. Data on magnesium, aluminum, and silicon and shorter wavelengths are presented.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 3: Eighth Annual Conference on Applications of X-ray Analysis, August 12-14, 1959 , 1959 , pp. 49 - 56
Copyright
Copyright © International Centre for Diffraction Data 1959

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