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Unification of “Standard Background” Technique using Scattered Radiation in X-Ray Fluorescence Analysis (XRF)

Published online by Cambridge University Press:  06 March 2019

V. I. Smolniakov
V. I. Smolniakov*
Affiliation:
Neutron Research Department, Leningrad Nuclear Physics Institute (LNPI), Academy of Sciences USSR 188350 Gatchina, Leningrad region, U.S.S.R.
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Abstract

Some x-ray fluorescence - concentration relationships in the framework of XRF were researched. Fundamental calculation approaches for primary fluorescence and incoherent scattering were realized for evaluation of matrix influence. A new binary approach was produced for the cases considered, and its unification was related to the empirical and regression types of the “standard background” technique, widely used in the analytical practice of XRF. It is confirmed that application of the calculations by fundamental parameters (FP) in combination with the empirical approach allows the reduction of the set of standards (to as few as one) in the analysis procedure with wide variations in matrices and concentrations, without loss of accuracy.

Type
X. Mathematical Methods in X-Ray Spectrometry (XRS)
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 737 - 742
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Sherman, J., Spectrochim, Acta 7;283 (1955).Google Scholar
2. Criss, J. W. and Birks, L. S., Anal. Chem. 40: 1080 (1968).Google Scholar
3. Software EDXRF ver, 1.32 by Tracor X-ray, Inc., USA (1990).Google Scholar
4. Smolniakov, V. I., paper presented for publ. in Joyrn, Plant Laboratory, Moscow.Google Scholar
5. Tertian, E., X-Ray Spectrom. 17: 1989 (1988).Google Scholar
6. Anderman, G., Kemp, J. V., Anal. Chem. 30:1306 (1955).Google Scholar
7. Losev, N. F., “Kolichestveimy rentgenospectrainy fluorescentny analiz”, Atomizdat, Moscow (1973).Google Scholar
8. Plotnikov, P. I. and Pshenichny, G. A., “Fluorescentny rentgeno-spectrainy snail z”, Nauka, Moscow (1973)Google Scholar
9. Bahtiarov, A. V., “Rentgenospectrainy fluorescentny analiz v geologii i geohimii”, Nedra, Leningrad (1985).Google Scholar
10. Bahtiarov, A. V., Equipment and Methods of X-Ray Anal, 21 :3 (1978).Google Scholar
11. Verman, N. A. and Stroganov, D. N, paper presented for publ, in Journ. Ore Concent rations, Leningrad.Google Scholar
12. de Boer, P.K.G., Spectrochim. Acta 448: 1171 (1989).Google Scholar
13. Browne, E. and Firestone, R. B., “Tables of Radioactive Isotopes”, Wiley-Interscience, New York (1986).Google Scholar
14. Saloman, E. B. and Hubbell, J. H., “X-ray Attenuation Coefficients”, NBSIR 86-3431, Gaithesburg (1986).Google Scholar
15. Blohin, H. A. and Sheveytzer, I. G., “Rentgenospectrainy spravochnik”, Nsuka, Moscow (1982).Google Scholar