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TXRF Spectrometer for Trace Element Detection

Published online by Cambridge University Press:  06 March 2019

F. Hegedüs ,
P. Winkler ,
P. Wobrauschek  and
Christina Streli
F. Hegedüs
Affiliation:
Paul Scherrer Institute (PSI) CH-5232 Villigen PSI, Switzerland
P. Winkler
Affiliation:
Paul Scherrer Institute (PSI) CH-5232 Villigen PSI, Switzerland
P. Wobrauschek
Affiliation:
Atominstitut der Oesterreichischen Universitaten Schuttelstrasse 115, A-1020 Vienna, Austria
Christina Streli
Affiliation:
Atominstitut der Oesterreichischen Universitaten Schuttelstrasse 115, A-1020 Vienna, Austria
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Extract

A method to measure low level iodine concentrations by means of a Total Reflectance X-Ray Spectrometer (TXRF) was presented at the 1986 and 1988 Denver X-Ray Conferences (Ref. 1 and 2.). The optimum set-up of the spectrometer for this purpose was obtained by using a Cu-anode tube. The collimated beam was two times totally reflected: first on the mirror and then on the synsil sample substrate. By these means the undesired high energy bremsstrahlung was almost eliminated. This operational mode is very convenient for iodine measurement by L-lines. The detection limit of iodine was as low as 100 pg.

For simultaneous measurement of several elements (I2<Z<83) it was necessary to change the set-up of the spectrometer.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 581 - 583
Copyright
Copyright © International Centre for Diffraction Data 1989

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References

1. Advances in X-Ray Analysis, Vol. 30, 85-88, 1987 Google Scholar
2. Advances in X-Ray Analysis, Vol. 32, 25L-Z53, 1989 Google Scholar