Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-09T07:52:08.010Z Has data issue: false hasContentIssue false

Two-Crystal X-Ray Spectrometer Attachment

Published online by Cambridge University Press:  06 March 2019

Leonid V. Azároff*
Affiliation:
Illinois institute of Technology, Chicago, Illinois
Get access

Abstract

A two-crystal spectrometer that makes full use of conventional diffractometet: or spectrometer motions has been constructed so that it can be easily attached to a commercial instrument. The requisite degree of parallelism of the two crystalrotation axes is maintained by keeping both parallel to a single ground surface. Special alignment aids have been constructed to facilitate the rapid alignment of the instrument, which can be operated manually in 1″ intervals or used for automatic scanning in steps of 0.01°. Some guide lines for comparing the relative performance of spectrometers in X-ray absorption spectroscopy are suggested.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1965

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Compton, A. H., “The Intensity of X-ray Reflection and the Distribution of Electrons in Atoms,” Phys. Rev. 9: 29, 1917.Google Scholar
2. Sandstrom, A. E., “Experimental Methods of X-ray Spectroscopy: Ordinary Wavelengths,” in: S. Flugge (ed.) Handbuck der Physik, Vol. 30, Springer-Verlag, Berlin, 1957, pp. 79245.Google Scholar
3. Compton, A. H. and Allison, S. K., X-rays in Theory and Experiment, 2nd ed., D. Van Nostrand Company, Inc., Princeton, 1935.Google Scholar
4. Otto von der Hey de, Newton Highlands 61, Massachusetts.Google Scholar
5. Klems, G. J., Das, B. N., and Azároff, L. V., “Single-Crystal Spectrometers for X-Ray Absorption Spectroscopy,” in: Developments in Applied Spectroscopy, Vol. 2, Plenum Press, New York, 1963, p. 275284.Google Scholar
6. Weissmann, S., Method for the Study of Lattice Inhomogeneitiei Combining X-Ray Microscopy and Diffraction Analysis, Rutgers University Rearch Bulletin, No. 39, 1956.Google Scholar
7. Parratt, L. G. and Hempstead, C. F., Correction of Complex Spectra for Instrumental Resolving Power, Part I: Model Windows, Air Force Office of Scientific Research Technical Report AFOSR TN-56-388, 1965; ASTIA No. AD 96046.Google Scholar