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Trace Analysis Using EDS: Applications to Thin-Film and Heterogeneous Samples

Published online by Cambridge University Press:  06 March 2019

B. J. Cross  and
J. E. Augenstine
B. J. Cross
Affiliation:
Kevsx Instruments San Carlos, CA 94070
J. E. Augenstine
Affiliation:
Kevsx Instruments San Carlos, CA 94070
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Extract

Critical to “Trace Analysis” measurement are the concepts of detection and quantification. Detection means positively identifying a chemical component. The term Minimum Detection Limit (MDL), used here, follows that of Currie, and is the smallest concentration that yields a net count, above system background, which will be detected with a 95% probability (with only a 5% probability of false detection).

Type
II. Determination of Low Concentration Levels by X-Ray Spectrometry
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990 , pp. 57 - 70
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

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