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A Systematic Method for Indexing Spots of Single Crystals in Laue X-Ray Photographs

Published online by Cambridge University Press:  06 March 2019

Y. A. Konnan*
Affiliation:
Westinghouse Electric Corporation Pittsburgh, Pennsylvania
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Abstract

The determination of the orientation of a single crystal by Laue X-ray photographs is dependent on the identification of the indices of the spots. At the present time, the determination of indices is done by various methods, none of which is entirely systematical. A method for establishing the indices of the spots which avoids a trial-and-error approach is described here. The method is graphical, uses a specially compiled table of erystallographic angles and is not dependent on the complexity of the structure of the crystal or its symmetry. An example of the cubic system is included. With more complex crystal structures the method becomes very laborious and the help of computer methods is suggested.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1963

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