X-ray spectrometry is an old technique dating back some sixty-odd years and although most of the early interest revolved around the qualitative aspects of the method it wasn't long before attempts were made to obtain quantitative data. One of the first recorded attempts was that by Coster and von Hevesey who in 1923 accurately determined the amount of hafnium in zirconium using tantalum as an internal standard. Glocker and Schreiber were the first to attempt calculation of X-ray characteristic line intensity from first principles although no attempt was made at that time to correct for secondary fluorescence. In von Hevesey's book, “Chemical Analysis by X-Rays,” published in 1932 , a whole chapter is devoted to what is called “Disturbing effects and their avoidance.” Among the effects discussed were primary and secondary absorbtion and third element effects. Matrix correction equations were developed although most of the quantitative work at that time was done using internal standards.