Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-20T09:27:32.598Z Has data issue: false hasContentIssue false

Substructure-Magnetic Property Correlation in Fe/Ag Composite Thin Films

Published online by Cambridge University Press:  06 March 2019

C. P. Reed
Affiliation:
Center for Materials Research and Analysis University of Nebraska-Lincoln Lincoln, NE
R. J. DeAngelis
Affiliation:
Center for Materials Research and Analysis University of Nebraska-Lincoln Lincoln, NE
Y. X. Zhang
Affiliation:
Center for Materials Research and Analysis University of Nebraska-Lincoln Lincoln, NE
S. H. Liou
Affiliation:
Center for Materials Research and Analysis University of Nebraska-Lincoln Lincoln, NE
R. J. Jacob
Affiliation:
Nano Probe Lab Markey Cancer Center University of Kentucky Lexington, KY
Get access

Abstract

A series of nanostructured Fe/Ag metal films were produced at various substrate temperatures to determine their magnetic characteristics. The magnetic coercivity was found to increase with the diffracting-particle size which is process controlled. The films produced at low substrate temperature (<200°C) consisted of small metallic clusters of Ag (<100 Å). As the substrate temperature was increased, the films exhibited increased crystallinity and larger diffracting-particle size. The position of the maximum in the particlesize distribution function and the width of the function increased with substrate temperature.

Type
XI. Thin Film and Semiconductor Characterization by X-Ray Diffraction
Copyright
Copyright © International Centre for Diffraction Data 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

(1) DeAngelis, J. R. J., Dhere, A. G., Lewis, J. D., Kuo, H., Application of X-Ray Diffraction Techniques to Study the Sintering of Catalysts, Sintering and Heterogeneous Catalysts. 182184, Plenum Publishing Corp., 1984.Google Scholar
(2) Gangulee, A., J. Appl. Crystalloqr., 7: 434, 1974.Google Scholar
(3) Mignot, J., Rondot, D., Acta. Met., 23: 1322, 1975.Google Scholar
(4) Rothman, R. L., Cohen, J. B., Advan. X-Ray Anal., 12: 208, 1969.Google Scholar
(5) DeAngelis, R. J., Dhere, A. G., Maginnis, M. A., Reucroft, P. J., Ice, G. E., Habenschuas, A., Synchrotron X-Ray Scattering for the Structural characterization of Catalysts, Advan. X-Ray Anal., 389394, Plenum Publishing Corp., 1987.Google Scholar
(6) Lewis, J. D., “Particle Size Analysis on Simulated X-Ray Diffraction Profiles,” Thesis, University of Kentucky, 1984.Google Scholar
(7) Chopra, K. L., “Thin Film Phenomena,” McGraw-Hill Book Co., 1969.Google Scholar
(8) Luborsky, F. E., J. Appl. Phys., 1715: 32, 1961.Google Scholar
(9) Zhang, Y. X., Liou, S. H., DeAngelis, R. J., Lee, K. W., Reed, C. P., Nazareth, A., The Process-Controlled Magnetic Properties in Nanostructured Fe/Ag Composite Films, to appear in J. Appl. Phys., April, 1991.Google Scholar