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Subnanosecond X-Ray Measurements Using a Unitary Organic Crystal and Image Converter Streak Camera

Published online by Cambridge University Press:  06 March 2019

R. A. Nuttelman ,
H. M. Epstein ,
J. W. Beal  and
P. J. Mallozzi
R. A. Nuttelman*
Affiliation:
Battelle's Columbus Laboratories, Columbus, Ohio 43201
H. M. Epstein
Affiliation:
Battelle's Columbus Laboratories, Columbus, Ohio 43201
J. W. Beal
Affiliation:
Battelle's Columbus Laboratories, Columbus, Ohio 43201
P. J. Mallozzi
Affiliation:
Battelle's Columbus Laboratories, Columbus, Ohio 43201
*
*presently at U. S, Air Force Academy, Colorado Springs, Colorado.
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Abstract

A time dependent x-ray diagnostic technique based on the fast rise time characteristics of unitary crystals is demonstrated, and a correction for decay time is determined for anthracene crystals. The method has a probable time resolution capability better than 10 picoseconds. The shape of the x-ray pulse emitted by laser-generated plasmas is measured by this method and found to be similar to the shape of the laser pulse for laser pulse widths of 1.5-3.5 nanoseconds.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 18: Twenty-Third Annual Conference on Applications of X-ray Analysis, August 7-9, 1974 , 1974 , pp. 197 - 203
Copyright
Copyright © International Centre for Diffraction Data 1974

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References

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