Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-23T14:53:33.323Z Has data issue: false hasContentIssue false
  • English
  • Français

Structural Characterization of Magnetic Recording Media by Using Grazing Incident and Conventional X-Ray Diffraction

Published online by Cambridge University Press:  06 March 2019

Po-Wen Wang
Po-Wen Wang*
Affiliation:
IBM E28A/502 5600 Cottle Rd. San Jose, Ca. 95193
Get access

Extract

In recent years, the microstructure of Co-based alloy magnetic thin film disks has been studied extensively by using a conventional x-ray diffraction (XRD) technique(1-4). Efforts to understand the relationship between the microstructure and the magnetic properties of disk had been limited due to the lack of depth resolution in the conventional theta-2theta scanning technique. In this paper, a fixed 0.5 degree of grazing incidence(5) 2-theta scan X-ray diffraction (GIXRD) technique was used to characterize the thin film disk microstructure and therefore to correlate with the magnetic properties.

Type
V. X-Ray Characterization of Thin Films
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 197 - 202
Copyright
Copyright © International Centre for Diffraction Data 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1) Yogi, T., Nguyen, T., Lambert, S., Gorman, G. and Castillo, G. Mat. Res. Soc. Symp. Proc. Vol.232. 1991 p3–p13.Google Scholar
2) Kawanabe, T., Park, J. and Naoe, M. Mat. Res. Soc. Symp. Proc. Vol.232. 1991 p21–p26 Google Scholar
3) Doerner, M., Wang, P., Mirzamaani, S. and Parker, D., Wall, A. Mat. Res. Soc. Symp. Proc. Vol.232. 1991 p27–p33 Google Scholar
4) Howard, J. K., Ahlert, R., and Lim, G., J. Appl. Phys. Vol. 61 P3834-383G, 1987 Google Scholar
5) Huang, T., Adv. X-Ray Anal. Vol.33 P 91–100, 1990 Google Scholar