Hostname: page-component-cd9895bd7-dzt6s Total loading time: 0 Render date: 2024-12-25T01:06:43.145Z Has data issue: false hasContentIssue false
  • English
  • Français

Stress Measurement in Stainless Steel by use of Monochromatic Cr-Kβ X-Rays and a Position Sensitive Detector

Published online by Cambridge University Press:  06 March 2019

Yasuo Yoshioka ,
Ken-ichi Hasegawa  and
Koh-ichi Mochiki
Yasuo Yoshioka
Affiliation:
Musashi Institute of Technology, 1 Tamaziitsumi, Setagaya, Tokyo 158, Japan
Ken-ichi Hasegawa
Affiliation:
Faculty of Engineering, University of Tokyo, 7 Ilongoh, Bunkyo, Tokyo 113, Japan
Koh-ichi Mochiki
Affiliation:
Faculty of Engineering, University of Tokyo, 7 Ilongoh, Bunkyo, Tokyo 113, Japan
Get access

Extract

X-ray stress analysis in austenltic stainless steel is generally carried out on the ϒFe(311) diffraction line produced by Cr- Kβ X-rays. However, it is often pointed out that not much reliance can be placed on the precision of the stress because the contrast between a diffraction peak and its background is poor. In addition, to measure the stress is sometimes impossible on a specimen which has martensite structure produced by thes train induced transformation, because the ϒFe(211) line appears in the neighborhood of the desired ϒFe(311) line, since Cr-K6 X-rays accompany Cr-Ka from a conventional X-ray source. If Cr-Ka X-rays can be eliminated and only Cr-KB X-rays directed on the specimen, only the λe(311) line with high contrast will be obtained and one can expect to measure the residual stress with high precision.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 24: Twenty-Ninth Annual Conference on Applications of X-ray Analysis, August 4-8, 1980 , 1980 , pp. 167 - 172
Copyright
Copyright © International Centre for Diffraction Data 1980

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Yoshioka, Y., Hasegawa, K. and Mochiki, K., “A Position-Sensitive Proportional Counter for Residual Stress Measurement by Means of Microbeam X-rays,” Advances in X-Ray Analysis 23:325 (1980).Google Scholar