A review of the procedures and efforts at the National Bureau of Standards (NBS) to provide for meaningful measurements through the use of Standard Reference Materials (SRM's) is presented.

The examples of NBS Standardization efforts for x-ray analysis range from basic metrology to applied environmental measurements. These examples include a determination of x-ray wavelength by a method which in part utilizes simultaneous x-ray and optical interferometry measurements of the atomic planes of near perfect silicon. In addition, Standard Reference Materials (SRM's) are being developed and applied to trace element analysis using x-ray fluorescence techniques. These efforts include development of SRM's for trace element analysis of air particulates. In another area, work is proceeding on the development of a silicon powder Standard Reference Material intended for x-ray diffractometer calibration. An effort to develop a suitable x-ray diffraction technique to determine the amount of quartz in mine dust is also underway. NBS efforts to provide SRM's for the calibration of electron microprobes and the validating of correction factor calculations are also described.