Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-27T06:52:19.909Z Has data issue: false hasContentIssue false

Standard Deviations in X-Ray Stress and Elastic Constants Due to Counting Statistics

Published online by Cambridge University Press:  06 March 2019

Masanori Kurita*
Affiliation:
Nagaoka University of Technology, Nagaoka, 940-21Japan
Get access

Abstract

X-ray diffraction can be used to nondestructively measure residual stress of polycrystalline materials. In x-ray stress measurement, it is important to determine a stress constant experimentally in order to measure the stress accurately. However, every value measured by x-ray diffraction has statistical errors arising from counting statistics. The equations for calculating the standard deviations of the stress constant and elastic constants measured by x-rays are derived analytically in order to ascertain the reproducibility of the measured values. These standard deviations represent the size of the variability caused by counting statistics, and can be calculated from a single set of measurements by using these equations. These equations can apply Lu any meuhud for x-ray stress ifiesuremenL. The variances of the x-ray stress and elastic constants are expressed in terms of the linear combinations of the variances of the peak position. The confidence limits of these constants of a quenched and tempered steel specimen were determined by the Gaussian curve method. The 95% confidence limits of the stress constant were -314 ± 25 MFa/deg.

Type
VII. X-Ray Stress Analysis
Copyright
Copyright © International Centre for Diffraction Data 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Macherauch, E., X-Ray Stress Analysis, Experimental Mechanics, Vol. 6 (1966), pp. 140-153.Google Scholar
2. Macherauch, E. and Wolfstieg, U. , Recent German Activities in the Field of X-Ray Stress Analysis, Materials Science and Engineering, Vol. 30 (1977), pp. 1-13.Google Scholar
3. Noyan, I.C. and Cohen, J.B. , “Residual Stress Measurement by Diffraction and Interpretation,” Springer-Verlag (1987), pp. 6274.Google Scholar
4. Kurita, M. , Confidence Limits of Stress Values Measured by X-Ray Diffraction, Journal of Testing and Evaluation, Vol. 11, No. 2 (1983), pp. 143149.Google Scholar
5. Kurita, M. , A Statistical Analysis of X-Ray Stress Measurement by the Gaussian Curve-Fitting Method, Journal of Testing and Evaluation, Vol. 9 No. 5(1981), pp. 285-291.Google Scholar
6. Kurita, M. , Residual Stress Measurement by X-Ray Diffraction with the Gaussian Curve Method and its Automation,“Role of Fracture Mechanics in Modern Technology, edited by Sih, G.C. , Nishitani, H. , and T., Ishihara ,”pp. 863-874, Elsevier Science Publishers B. V. (1987).Google Scholar
7. Kurita, M. , A New X-Ray Method for Measuring Residual Stress and Diffraction Line Broadness and its Automation, NDT International, Vol. 20, No. 5(1987), pp. 277284.Google Scholar
8. Klug, H.P. and Alexander, L.E. ,“X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials,” John Wiley (1974), pp. 360364.Google Scholar
9. Kurita, M. , Statistical Variation in Diffracted Intensity in Residual Stress Measurement by X-Rays, Transactions of the Japan Society of Mechanical Engineers, Vol. 43, No. 368(1977), pp. 13581360 [in Japanese].Google Scholar
10. Kurita, M. , Miyagawa, M. , Sumiyoshi, M. , and Sakiyama, K. , JSME International Journal. , Vol. 30, No. 260 (1987), pp. 248254.Google Scholar
11. Bowker, A.H. and Lieberraan, G.J. , “Engineering Statistics,” Prentice-Hall (1959), pp. 62, 48, 49.Google Scholar