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Some Topographic Observations of the Effects of Dynamical Diffraction in Imperfect Metal Crystals

Published online by Cambridge University Press:  06 March 2019

William J. Boettinger ,
Harold E. Burdette ,
Edward N. Farabaugh  and
Masao Kuriyama
William J. Boettinger
Affiliation:
Institute for Materials Research National Bureau of Standards Washington, D.C. 20234
Harold E. Burdette
Affiliation:
Institute for Materials Research National Bureau of Standards Washington, D.C. 20234
Edward N. Farabaugh
Affiliation:
Institute for Materials Research National Bureau of Standards Washington, D.C. 20234
Masao Kuriyama
Affiliation:
Institute for Materials Research National Bureau of Standards Washington, D.C. 20234
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Abstract

X-ray diffraction topographs obtained in the anomalous transmission geometry contain images which are quite different from those obtained from thin crystals (μL<=l). In this paper various topographic images which are unique to thick crystals (μL>10) will be presented and discussed in terms of dynamical diffraction in imperfect crystals. First, it is observed in topographs that images of crystal imperfections caused by disruption of the anomalous transmission effect are slightly broader or more diffuse in the H-diffracted (Bragg-diffracted) beam than in the O-diffracted (transmitted beam). These observations have been made in both copper and nickel crystals. Such broadening can be explained by the presence of unique extinction terms in the expression for the intensity of the dynamically diffracted beam in an imperfect crystal.

Type
X-Ray Topography
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 207 - 219
Copyright
Copyright © International Centre for Diffraction Data 1976

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References

1. Boettinger, W. J., Burdette, H. E., Kuriyama, M. and Green, R. E. Jr., “Asymmetric Topographic Camera,” Rev. Sci. Instrum. 47, 906–911 (1976).Google Scholar
2. Kuriyama, M., Boettinger, W. J. and Burdette, H. E., “Crystal Imperfections and Magnetic Domain Walls in Thick Czochralski-Grown Nickel Single Crystals,” in Advances in X-Ray Analysis, Vol. 20 (1976).Google Scholar
3. Kuriyama, M., “X-Ray Diffraction from a Crystal Containing Isolated Imperfections,” Acta Cryst, A25, 682–693 (1969).Google Scholar
4. Kuriyama, M., Boettinger, W. J. and Burdette, H. E., “X-Ray Topographic Observation of Magnetic Domains in Czochralski-Grown Nickel Single Crystals in Anomalous Transmission Geometry,” J. Appl. Phys. 47 (11) (1976).Google Scholar
5. Polcarová, M. and Gemperlová, J., “Distortion of an Fe-Si Single Crystal and X-Ray Topographic Contrast due to a 90° Ferromagnetic Domain Wall,” phys. stat. sol, 32, 769–778 (1969).Google Scholar