Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-23T12:24:43.308Z Has data issue: false hasContentIssue false
  • English
  • Français

Some Recent Applications of X-Ray Topography

Published online by Cambridge University Press:  06 March 2019

A. R. Lang
A. R. Lang*
Affiliation:
H. H. Wills Physics Laboratory University of Bristol, England
Get access

Abstract

Dislocations, Inclusions, and Precipitates. Impurity precipitated after growth and foreign particles accidentally included during growth both produce intense local strain fields which give rise to diffraction contrast effects resembling those seen in electron microscope images of precipitates. The relationship between the dislocation configuration and these localized strain centers can show whether the latter arise from inclusions or precipitates. Precipitates will generally be found strung along the grown-in dislocations, decorating them. On the other hand, inclusions often generate dislocations by lattice closure errors; such dislocations then fan out from the inclusion in the general direction of advance of the growth interface.

Twin Boundaries and Fault Surfaces. The cases when the twins have parallel lattices, such as in Brazilian and Dauphiné twinning in quartz, are interesting. When the crystals on either side of the twin boundary are both Bragg reflecting, the twin boundary may exhibit ‘stacking fault’ type fringes. From an analysis of the variation of visibility of these fringes in different reflections, the fault vector at the twin boundary and its variation with boundary orientation may be found. In quartz, other types of fault surfaces producing fringe contrast may lie parallel to growth horizons or they may mark growth sector boundaries. In synthetic quartz, they can also mark cell boundaries under conditions of cellular growth.

Internal Magnetic Domain Structures. In plates of Fe + 3% Si roughly parallel to (110), a variety of previously undetected domain structures has been discovered and analyzed. Diffraction contrast is produced by 90° domain walls but not by 180° walls. The 90° walls produce strong diffraction contrast even though the magnetostriction of silicon-iron is only about 10−5. In plates parallel to (112), the main lamination pattern below the complex pattern of surface closures can be revealed and, in favorable cases, interpreted.

X-ray Moiré Patterns. The most direct method of observing X-ray moiré patterns—by topography of one crystal closely superimposed upon another—involves considerable theoretical complexities and produces a variety of curious diffraction patterns. However, it shows promise of providing a means for the comparison of lattice spacings to about one part in 107 and for mapping strain fields very sensitively.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 10: Fifteenth Annual Conference on Applications of X-ray Analysis, August 10-12, 1966 , 1966 , pp. 91 - 107
Copyright
Copyright © International Centre for Diffraction Data 1966

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Lang, A. R., “Dislocations in Diamond and the Origin of Trigons,” Proc. Roy. Soc. (London) A278: 234, 1964.Google Scholar
2. Frank, F. C. and Lang, A. R., “X-Ray Topography of Diamond,” in Physical Properties of Diamond, ed. R. Berman, Clarendon Press, Oxford, England, 1965, Chapter III, p. 69.Google Scholar
3. Takagi, M. and Lang, A. R., “X-Ray Bragg Reflection, ‘Spike’ Reflection, and Ultra-violet Absorption Topography of Diamond,” Proc. Roy, Soc. (London) A281: 310, 1964.Google Scholar
4. Kamiya, Y. and Lang, A. R., “On the Structure of Coated Diamonds,” Phil. Mag. 11: 347, 1965.Google Scholar
5. Kamiya, Y. and Lang, A. R., “X-Ray Diffraction and Absorption Topography of Synthetic Diamonds,” J. Appl. Phys. 36: 579, 1965.Google Scholar
6. Lawn, B., Kamiya, Y., and Lang, A. R., “An X-Ray Topographic Study of Planar Growth Defects in a Natural Diamond,” Phil. Mag. 12: 177, 1965.Google Scholar
7. Schlössin, H. H. and Lang, A. R., “A Study of Repeated Twinning, Lattice Imperfection, and Impurity Distribution in Amethyst,” Phil. Mag. 12: 283, 1965.Google Scholar
8. Authier, A., Rogers, C. B., and Lang, A. R., “On the Macroscopic Distribution of Dislocations in Single Crystals of High-Purity Recrystallized Aluminium,” Phil. Mag. 12: 547, 1965.Google Scholar
9. Lang, A. R. and Polcarová, M., “X-Ray Topographic Studies of Dislocations in Iron-Silicon Alloy Single Crystals,” Proc. Roy. Soc. (London) A285: 297, 1965.Google Scholar
10. Lang, A. R., “Studies of Individual Dislocations in Crystals by X-Ray Diffraction Micro - radiography,” J. Appl. Phys. 30: 1748, 1959.Google Scholar
11. Kato, N. and Lang, A. R., “A Study of Pendellôsung Fringes in X-Ray Diffraction,” Acta. Cryst. 12: 787, 1959.Google Scholar
12. Yoshimatsu, M., “Some Observations of Imperfections in ADP Single Crystals by X-Ray Diffraction Micrography,” Japan. J. Appl. Phys. 5: 29, 1965.Google Scholar
13. Kato, N., Usami, K., and Katagawa, T., “The X-Ray Diffraction Image of a Stacking Fault,” Advances in X-Ray Analysis, Vol. 10, ed. G. R. Mallett and J. B. Newkirk, Plenum Press, New York, 1967, pp. 46–66.Google Scholar
14. Kato, N., “Wave-Optical Theory of Diffraction in Single Crystals,” in Crystallography and Crystal Perfection, ed. G. N. Ramachandran, Academic Press, New York and London, 1963, p. 153.Google Scholar
15. Frondel, C., Dana's System of Mineralogy, Vol. III. Silica Minerals, 7th ed., Wiley, New York and London, 1962.Google Scholar
16. Lang, A. R., “The Orientation of the Miller-Bravais Axes of Alpha Quartz,” Acta Cryst, 19: 290, 1965.Google Scholar
17. Lang, A. R., “A Method for the Examination of Crystal Sections Using Penetrating Characteristic X-Radiation,” Acta Met. 5: 358, 1957.Google Scholar
18. Lang, A. R., “The Projection Topograph; A New Method in X-Ray Diffraction Microradiography,” Acta Cryst. 12: 249, 1959.Google Scholar
19. Phillips, V. A. and Livingston, J. D., “Direct Observation of Coherency Strains in a Copper-Cobalt Alloy,” Phil. Mag. 7: 969, 1962.Google Scholar
20. Wilkens, M. and Meier, F., “Zur Kontrastbreite rontgenographisch abgebildeter Versetzungen,” Z. Naturforsch. 18a: 26, 1963.Google Scholar
21. Hart, M., “Dynamical X-Ray Diffraction in the Strain Fields of Individual Dislocations,” Thesis, University of Bristol, 1963.Google Scholar
22. Lang, A. R., “X-Ray Topographic Determination of the Sense of Pure Strew Dislocations,” Z. Namrforsch. 20a: 636, 1965.Google Scholar
23. Chikawa, J.-I., “X-Ray Topographic Observation of Dislocation Contrast in Thin Cadmium Sulfide Crystals,” J. Appl. Phys. 36: 3496, 1965.Google Scholar
24. Authier, A. and Sauvage, M., “Etudes Topographiques de défauts dans les Cristaux. Contraste et applications,” Seventh International Congress of Crystallography, Moscow, July 1966, paper 2.2.Google Scholar
25. Whelan, M. J. and Hirsch, P. B., “Electron Diffraction from Crystals Containing Stacking Faults,” Phil. Mag. 2: 1121, 1303. 1957.Google Scholar
26. Schwuttke, G. H. and Sils, V., “X-Ray Analysis of Stacking Fault Structures in Epitaxially Grown Silicon,” J. Appl. Phys. 34: 3127, 1963.Google Scholar
27. Yoshimatsu, M., Kohra, K., and Shimbu, I., “X-Ray Observation of Lattice Defects using a Crystal Monochromator,” in Direct Observation of Imperfections in Crystals, ed. J. B. Newkirk and J. H. Wernick, Interscience, New York and London, 1962, p. 461.Google Scholar
28. Kato, N., “Pendellôsung Fringes in Distorted Crystals, Parts I, II and III,” J. Phys. Soc. Japan 18: 1785, 1963; 19: 67, 971, 1964.Google Scholar
29. Hart, M., “Observations of Pendellosung Fringes in Eiastically Deformed Crystals,” Appl. Phys. Letters 7: 96, 1965.Google Scholar
30. Kato, N. and Ando, Y., “Contraction of Pendellösung Fringes in Distorted Crystals,” J. Phys. Soc. Japan 21: 964, 1966.Google Scholar
31. Ando, Y. and Kato, N., “X-Ray Diffraction Patterns of an Eiastically Distorted Crystal,” Acta Cryst. 21: 284, 1966.Google Scholar
32. Lang, A. R., “Mapping Dauphiné and Brazil Twins in Quartz by X-Ray Topography,” Appl. Phys. Letters 7: 168, 1965.Google Scholar
33. Craik, D. J. and Tebblc, R. S., “Ferromagnetism and Ferromagnetic Domains,” North-Holland, Amsterdam, 1965.Google Scholar
34. Frank, F. C., Kaczér, J., Lang, A. R., and Polcarova, M., in preparation.Google Scholar
35. Polcarová, M. and Lang, A. R., “X-Ray Topographic Studies of Magnetic Domain Configurations and Movements,” Appl. Phys. Letters 1: 13, 1962.Google Scholar
36. Lang, A. R. and Miuscov, V. F., “Angstrom-Scale Displacements Revealed by X-Ray Moiré Topographs,” Appl. Phys. Letters 7: 214, 1965.Google Scholar
37. Chikawa, J. -I., “X-Ray Observation of Moiré Patterns with Superposed CdS Crystals,” Appl Phys. Letters 7: 193, 1965.Google Scholar
38. Bonse, U. and Hart, M., “An X-Ray Interferometer,” Appl. Phys. Letters 6: 155, 1965.Google Scholar