Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-16T16:12:36.262Z Has data issue: false hasContentIssue false

Shadow: A System for X-ray Powder Diffraction Pattern Analysis

Published online by Cambridge University Press:  06 March 2019

Scott A. Howard*
Affiliation:
Department of Ceramic Engineering University of Missouri- Rolla Rolla, Missouri 65401
Get access

Extract

The Shadow system consists of a set of programs and files, the relation of which is illustrated in Figures 1 and 2. Of the three programs in the system, Shadow and XRDPLT are used routinely. The third, INSCAL, is used in the determination of various parameters characterizing the instrument. Two files, Shadow.DFT and XRDPLT.DFT, contain default values for parameters controlling the reduction and display of data. A third file, WSGDAT, contains the instrument parameters.

Type
VIII. Applications of Digitized XRD Patterns
Copyright
Copyright © International Centre for Diffraction Data 1988

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Brown, A. & Edmonds, J. W. (1980). Adv. in X-ray Anal. , 23. 361367.Google Scholar
Howard, S. A. & Snyder, R. L. (1985). Adv. in X-ray Anal. , 26. 7381.Google Scholar
Howard, S. A. & Snyder, R. L. (1988). Submitted , J. Appl. Cryst.Google Scholar
Howard, S. A. , Yau, J. K. , Anderson H. A. (1988). In press, J. Appl. Phys.Google Scholar
William, son G. K. & Hall, W. H. (1953). Acta. Met. 1, 2231.Google Scholar
Yau, J. K. & Howard, S. A. (1988). Submitted, J. Appl. Cryst.Google Scholar