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Separation of Kα Doublet for Profile Analysis by Use of FFT

Published online by Cambridge University Press:  06 March 2019

Yasuo Yoshioka  and
Shinichi Ohya
Yasuo Yoshioka
Affiliation:
Musashi Institute of Technology, 1-28 Tamazutsumi, Setagaya, Tokyo 158, Japan
Shinichi Ohya
Affiliation:
Musashi Institute of Technology, 1-28 Tamazutsumi, Setagaya, Tokyo 158, Japan
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Extract

Line-profile analysis is important for material evaluation as well as x-ray stress analysis. In the general case, the half-value breadth of the Kα doublet is used as the line-profile parameter, but it is preferable to use the half-value breadth of the Kα1 diffraction profile because of high resolution.

Type
X. XRD Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 623 - 629
Copyright
Copyright © International Centre for Diffraction Data 1992

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References

1) Taira, S., Yoshioka, Y. and Sakata, T.; Proc. 9th Japan Cong, on Testing Materials. pp 48-53(1966)Google Scholar
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3) Yoshioka, Y. and Majima, H.; Fracture Mechanics and Technology, 11, pp 1573–1584(1977)Google Scholar