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Sensitivity Improvement and Stabilization For Ultra Light Element Analysis by X-Ray Spectrometry

Published online by Cambridge University Press:  06 March 2019

K. Toda ,
H. Kohno ,
T. Arai ,
Y. Araki  and
G. Haraill
K. Toda
Affiliation:
Rigaku Industrial Corporation, Osaka, Japan
H. Kohno
Affiliation:
Rigaku Industrial Corporation, Osaka, Japan
T. Arai
Affiliation:
Rigaku Industrial Corporation, Osaka, Japan
Y. Araki
Affiliation:
Rigaku/USA, Inc., Danvcrs, MA USA
G. Haraill
Affiliation:
Rigaku/USA, Inc., Danvcrs, MA USA
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Extract

Many light and ultra-light element analysis problems have been addressed by X-ray fluorescence. Recent innovative features of X-ray spectrometers have extended the applicability of X-ray fluorescence to ultra-light element analysis. Sensitivities have improved through the use of a newly developed end window X-ray tube. Selection of analyzing optics conditions optimize to some degree the sensitivity/resolution/intensity problems. Instrument stability is greatly improved by simply monitoring and controlling the vacuum within the analyzing chamber. Data are presented to illustrate the effects of these novel instrument components as well as describing several new application techniques for ultra-light element analysis.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 629 - 637
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

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