Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-23T13:59:50.925Z Has data issue: false hasContentIssue false
  • English
  • Français

Scrip-Fortan IV Software for Quantitative XRD

Published online by Cambridge University Press:  06 March 2019

Edward R. Wong ,
John Yeko ,
Philip Engler  and
Richard A. Gerron
Edward R. Wong
Affiliation:
Sohio Research Center, 4440 Warrensville Center Road, Cleveland, Ohio 44128
John Yeko
Affiliation:
Sohio Research Center, 4440 Warrensville Center Road, Cleveland, Ohio 44128
Philip Engler
Affiliation:
Sohio Research Center, 4440 Warrensville Center Road, Cleveland, Ohio 44128
Richard A. Gerron
Affiliation:
Sohio Research Center, 4440 Warrensville Center Road, Cleveland, Ohio 44128
Get access

Extract

X-ray diffraction is ideal for quantitative crystalline phase determination in solid mixtures. Each phase of the mixture will produce its characteristic lines independent of other phases that may or may not be present when diffracting an X-ray beam and will be “proportional” to the amount of the phase present.

Type
III. Quantitative XRD Analysis
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 157 - 162
Copyright
Copyright © International Centre for Diffraction Data 1982

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. McCarthy, G. J. and Gehringer, R. C., “Internal Standards for Quantitative X-Ray Phase Analysis:Crystalline and Solid Solution”, Advances in X-Ray Analysis, Vol. 20, 1980, 253–2.Google Scholar
2. Chung, F. H., “A New X-Ray Diffraction Method for Quantitative Multicomponent Analysis:, Advances in X-Ray Analysis, Vol. 17, 1973, 106–2.Google Scholar
3. Alexander, L. E., “Forty Years of Quantitative Diffraction Analysis”, Advances in X-Ray Analysis, Vol. 20, 1976, 1-13.Google Scholar
4. Klug, H. and Alexander, L. E., X-Ray Diffraction Procedures, John Wiley and Sons, Inc., New York, 1974, 531–2.Google Scholar
5. Leroux, J., Lennox, D. H., and Kay, K., “Direct Quantitative X-Ray Analysis”, Anal. Chem., Vol. 25, 1953, 740–2.Google Scholar
6. Yeko, J. D., “Quantitative Analysis of Minerals by X--Ray Powder Diffraction”, MS Thesis, Texas Tech. Univ., 1980.Google Scholar
7. Cullity, B. D., Elements of X-Ray Diffraction, 2nd Edition, Addison-Wesley, Inc., 1978, 1-31.Google Scholar
8. Hubbard, C.R. and Smith, D. K., “Experimental and Calculated Standards for Quantative Analysis by Powder Diffraction:, Advances in X-Ray Analysis, Vol. 30* 1976, 27-39.Google Scholar
9. Gavish, E. and Friedman, G. M., “Quantitative Analysis of Calcite and Mg-Calcite by X-Ray Diffraction:Effect of Grinding of Peak Height and Peak Area,:Sed., Vol. 20, 437–2.Google Scholar