No CrossRef data available.
Article contents
Residual Stress and Microstructural Characterization Using Rietveld Refinement of a Carburized Layer in a 5120 Steel
Published online by Cambridge University Press: 06 March 2019
Extract
Rietveld refinement of X-ray diffraction patterns has been used to provide microstructural information complementary to conventional X-ray residual stress measurements through a carburized layer containing a maximum vol. 25 % of retained austenite. Layers in a simple specimen were removed incrementally by electropolishing and, at each depth in addition to conventional residual stress measurements in both the martensite and retained austenite, data were collected at ѱ = 0 for Rietveld refinement. The refinements provide accurate values for the lattice parameters in the respective phases that can be related to carbon content and micro-structure. Besides to providing qualitative information concerning the microstructure and possible surface decarburization, the c/a ratio of the martensite potentially offers an independent technique for determining carbon content profiles
- Type
- Research Article
- Information
- Copyright
- Copyright © International Centre for Diffraction Data 1995