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Residual Stress Analysis in Steels Having Preferred Orientation by Use of Synchrotron Radiation Source

Published online by Cambridge University Press:  06 March 2019

Yasuo Yoshioka  and
Hisaaki Matsui
Yasuo Yoshioka
Affiliation:
Musashi Institute of Technology 1 Tamazutsumi, Setagaya, Tokyo 158, Japan
Hisaaki Matsui
Affiliation:
Fanuc Ltd. Oshino, Yamanashi 401-05, Japan
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Extract

In the field of X-ray stress analysis, a diffraction plane at a high Bragg angle region has to be selected in order to determine the precise value of stress. But stress analysis using a most desired (hkl)- plane is not always possible. The use of synchrotron radiation (SR) enables the stress analysis using many (hkl)-planes with high accuracy by providing a perfectly monochromaticed X-ray beam having an optional wave length. Such features of SR ate most suitable for the stress analysis on materials having preferred orientation.

Type
III. X-Ray Stress/Strain Determination, Fractography, Diffraction, Line Broadening Analysis
Information
Advances in X-Ray Analysis , Volume 31: Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987 , 1987 , pp. 213 - 222
Copyright
Copyright © International Centre for Diffraction Data 1987

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References

Yoshioka, Y, Matsui, H. et al., J. JSMS (in Japanese), 35:755(1986)Google Scholar
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