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Reproducibility and Precision of Measurements of Guinier Powder Patterns Using Powdered Silicon Calibrant

Published online by Cambridge University Press:  06 March 2019

A. Brown ,
J. W. Edmonds  and
C. M. Foris
A. Brown
Affiliation:
Studsvik Energiteknik AB, Nyköping, Sweden S-611 82
J. W. Edmonds
Affiliation:
The Dow Chemical Co., Midland, Michigan 48640
C. M. Foris
Affiliation:
E. I. du Pont de Nemours & Co., Wilmington, Delaware 19898
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Abstract

Calibrated powder patterns of a number of high symmetry crystalline materials were recorded in three different Guinier-type focusing cameras. The films were then measured by three different techniques, one visual and two instrumental. Cell parameters were calculated by three different data reduction procedures. The aim of the work was to establish the level of reproducibility for cell parameters obtained in routine work with these instruments.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 24: Twenty-Ninth Annual Conference on Applications of X-ray Analysis, August 4-8, 1980 , 1980 , pp. 111 - 120
Copyright
Copyright © International Centre for Diffraction Data 1980

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References

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