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Rapid Composition-Depth With X-Ray Diffraction: Theory and Practice

Published online by Cambridge University Press:  06 March 2019

Karl E. Wiedemann  and
Jalaiah Unnam
Karl E. Wiedemann
Affiliation:
Analytical Services and Materials, Inc. 28 Research Drive Hampton, VA 23666
Jalaiah Unnam
Affiliation:
Analytical Services and Materials, Inc. 28 Research Drive Hampton, VA 23666
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Abstract

High precision composition-depth profiles can be determined quickly using a recent development. This method requires that noncompositional broadening arising from the instrument, crystal defects, and the radiation source be removed from the diffraction pattern before calculating the composition-depth profile. Effective deconvolution techniques, profiling theory, methodology of profiling, and the effect of residual noncompositional broadening on the profile are discussed. Examples include statistical analyses of error in the profile due to random counting errors and variance in the lattice parameter calibration.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 29: Thirty-Fourth Annual Conference on Applications of X-ray Analysis, August 5-9, 1985 , 1985 , pp. 193 - 202
Copyright
Copyright © International Centre for Diffraction Data 1985

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References

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