Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-27T03:37:15.901Z Has data issue: false hasContentIssue false

Quantitative X-Ray Fluorescence Analysis With Variable Take-Off Angle

Published online by Cambridge University Press:  06 March 2019

H. Ebel*
Affiliation:
Institut für Angewandte Physik, University of Technology and Ludwig Boltzmann-Institut für Festkörperphysik, Vienna, Austria
Get access

Abstract

A solution of the intensity equation of X-ray Fluorescence analysis is possible either by the assumption of an effective wave length or by a variation of the take-off angle. When the intensity of the fluorescence radiation is measured as a function of the take-off angle, the extrapolation of this curve against take-off parallel to the flat sample surface offers a simple evaluation of the intensity equation. Since the influence of the secondary excitation is also taken in to account the composition and the mass per unit area of samples can be investigated as well as mass absorption coefficients and mean wavelengths of the polychromatic primary radiation.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1969

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Shiraiwa, T. and Fujino, N., “Application of theoretical calculations to X-ray fluorescent analysis”, The Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy (1967).Google Scholar
2 Jenkins, R. and de Vries, J.L., “Practical X-ray Spectrometry”, Philips Technical Library, 1925(1967).Google Scholar
3 Ebel, H., Wagendristel, A. and Judtmann, H., “Messungen der Dichte dünner Aufdampf schichten”, Zeitschr. f. Naturforschg 23a: 18631864 (1968).Google Scholar
4 Meizer, W., “Die effective Wellenlänge in der quantitativen Röntgenfluoreszenzanalyse” T. Dissertation, Technische Hochschule Wien (1969).Google Scholar
5 Perez, P. R., “Zur röntgenfluoreszenzanalytischen Absolutbestimmung der Dicke ebener dünner Elementschichten”, Diplomarbeit, Technische Hochschule Wien (1966).Google Scholar
6 Ho, W. C., “Quantitative Röntgenfluoreszenzanalyse ebener dünner Legierungsschichten”, Dissertation, Technische Hochschule Wien (1969).Google Scholar
7 Ebel, H., “Röntgenfluoreszenzanalytische Bestimmung Von Massenschwächungskoeffizienten”, Spektrometertagung, Bern (1968).Google Scholar
8 Gillain, E. and Heal, H. T., Some problems in the Analysis of steels by X-ray fluorescence”, Brits. J. Appl.Phys. 3, 353 (1952).Google Scholar
9 Sherman, J., “The theoretical derivation of Fluorescent X-ray intensities from mixturesSpectrochim. Acta 7, 284 (1955).Google Scholar