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Quantitative Analysis of Trace Amounts of Tin in Steel by Means of X-Ray Fluorescence

Published online by Cambridge University Press:  06 March 2019

T. S. Whitehouse
T. S. Whitehouse*
Affiliation:
General Electric Company, West Lynn, Massachusetts
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Abstract

X-ray fluorescence as a method of chemical analysis has been receiving considerable attention due to its inherent advantages of being non-destructive and generally less time consuming than conventional methods. A method of analysis is described using a pulse height analyzer in conjunction with the X-ray fluorescent unit which further extends the range of analysis.

This combination was used to measure tin in steel as low as .01% to an accuracy of .003%. Other similar analyses are suggested.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 2: Seventh Annual Conference on Industrial Applications of X-ray Analysis, August 13-15, 1958 , 1958 , pp. 257 - 260
Copyright
Copyright © International Centre for Diffraction Data 1958

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