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Procedures to Run an Automated Micro—Densitometer on a Shared Computer System

Published online by Cambridge University Press:  06 March 2019

Armin Segmüller  and
Henderson Cole
Armin Segmüller
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, New YorkU. S. A. 10598
Henderson Cole
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, New YorkU. S. A. 10598
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Abstract

A commercial micro-densitometer is run by an IBM 1800 computer under time sharing. It is used for measuring the transmission of mass spectrometer plates and x-ray powder diffraction films. The x-ray data are processed on the 1800 computer in three steps: First a linear background approximation is performed by least-squares methods, then the data corrected for background are searched for peaks and the position of the peaks is determined. After an optional manual peak selection facilitated by CRT display of the data and results, d-spacings are calculated and printed out together with approximate intensities. The programs are also used for processing data obtained By automated x-ray diffractometers.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 14: Nineteenth Annual Conference on Applications of X-ray Analysis, August 5-7, 1970 , 1970 , pp. 338 - 351
Copyright
Copyright © International Centre for Diffraction Data 1970

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References

Cole, H., “Computer-Operated X-Ray Laboratory Equipment”, IBM Journal 13: 5, 1969.Google Scholar
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Segmüller, A., “Automated Lattice Parameter Determination on Single Crystals”, in Henke, B. L., Newkirk, J. B. and Mallet, G. R., Editors, Advances in X-Ray Analysis, Vol. 13, Plenum Press, New York, 1970, p. 455.Google Scholar
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