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Preparation of Electron Probe Microanalyzer Standards using a Rapid Quench Method

Published online by Cambridge University Press:  06 March 2019

J. I. Goldstein ,
F. J. Majeske  and
H. Yakowitz
J. I. Goldstein
Affiliation:
Goddard Space Flight Center National Aeronautics and Space Administration Greenbelt, Maryland
F. J. Majeske
Affiliation:
Melpar, Inc. Goddard Space Flight Center National Aeronautics and Space Administration Greenbelt, Maryland
H. Yakowitz
Affiliation:
National Bureau of Standards Washington, D.C.
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Abstract

Standards for microprobe analysis can be made to serve two purposes: (a) proposed correction models can be tested with them, and (b) analysis can be performed more accurately in the system which includes the standard. Few microprobe standards presently are available because they must be homogeneous on the micron scale and their composition must be known accurately. A modified Duwez splat cooling method is described which enables the investigator to prepare suitable standards in most cases. The apparatus which is relatively simple and inexpensive is described in detail. The systems Au-Si and Al-Mg were chosen as test cases. Suitable standards were prepared at different concentrations in each system. The analytical results for all compositions in Al-Mg are presented and discussed.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 10: Fifteenth Annual Conference on Applications of X-ray Analysis, August 10-12, 1966 , 1966 , pp. 431 - 446
Copyright
Copyright © International Centre for Diffraction Data 1966

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