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Precision and Reproducibility of Lattice Parameters from Guinier Powder Patterns: Follow-Up and Assessment

Published online by Cambridge University Press:  06 March 2019

A. Brown
Affiliation:
Studsvik Energiteknik AB, Nyköping, Sweden S-611 82
C.M. Foris
Affiliation:
E.I. du Pont de Nemours & Co., Central Research & Development Dept., Wilmington, Delaware 19898
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Abstract

Lattice parameters, obtained by least-squares refinement of data from calibrated Guinier powder patterns, are compared in an effort to establish procedures for obtaining reproducible 2θ values with Guiniertype focusing camera techniques. The calibration procedure is discussed and a method of calculation to reduce loss of precision is proposed. Effects of particle size and crushing are also discussed as well as some sources of error such as use of only selected calibrant lines, film background, and mutual interference of powder lines.

Type
I. Accuracy in X-Ray Powder Diffraction
Copyright
Copyright © International Centre for Diffraction Data 1982

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References

1. JCPDS-International Centre for Diffraction Data, 1601 Park Lane, Swarthmore, PA 19081, private communication, proceedings of technical subcommittee meetings.Google Scholar
2. Brown, A., Edmonds, J. W. and Foris, C. M., “Reproducibility and Precision of Guinier Patterns Using Powdered Silicon Calibrant”, Adv. X-ray Anal. 24 111 (Edited by Smith, Deane K., Plenum Press 1981).Google Scholar
3. Hubbard, C. R., Swanson, H. E. and Mauer, F. A., “A Silicon Powder Diffraction Standard Reference Material”, J. Appl. Crystallography 8 45 (1975).Google Scholar
4. Moller, M., “On the Calibration and Accuracy of the Guinier Camera for the Determination of Interplanar Spacings”, Atomenergi Report, AE-67 (1962).Google Scholar
5. Brown, A., “Optimal Calibration Curves for Guinier-type Focusing Cameras”, Adv. X-ray Anal. 2 289 (Edited by Barrett, C. S., Leyden, D. E., Newkirk, J. B. and Ruud, C. O., Plenum Press, 1978).Google Scholar
6. Texas Instruments, “TI Programmable 58/59, Applied Statistics“ 3-8 and 514 (Texas Instruments, Inc. 1977).Google Scholar
7. Brown, A., “Precision Lattice Parameter Measurements with Guinier Camera and Counter Diffractometer:Comparison and Reconciliation of Results”, Adv. X-ray Anal. 26.Google Scholar
8. Edmonds, J. W., “Precision Guinier X-ray Powder Diffraction Data”, National Bureau of Standards Special Publication 567. Proceedings of Symposium on Accuracy in Powder Diffraction, Gaithersburg, MD., 1979 (Edited by Block, S. and Hubbard, C. R., NBS, 1980).Google Scholar