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Practical and "Unusual" Applications in X-ray Diffraction Using Position Sensitive Detectors
Published online by Cambridge University Press: 06 March 2019
Abstract
Position sensitive proportional counters (PSPCs) increase the scope of X-ray diffraction analyses. High pressure flow through type PSPCs can significantly reduce data collecting times due to She ability for simultaneous data collection over large two-theta ranges. This inherent characteristic allows the diffraction user broad capabilities such as scanning very rapidly over large two- theta ranges or collecting data in real time over shorter two-theta ranges without scanning. Thus, we have been able to perform detailed high- temperature experiments in relatively short time frames, observe phase transitions and reactions as they occur, and perform unusual experiments such as observing the crystallization of a plasma spray in-situ.
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- VII. Solid State and Position-Sensitive Detectors for XRD
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- Copyright © International Centre for Diffraction Data 1990