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Phase Identification using Whole-Pattern Matching

Published online by Cambridge University Press:  06 March 2019

D. K. Smith ,
S. Q. Hoyle  and
G. G. Johnson Jr.
D. K. Smith
Affiliation:
Department of Geosciences and Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802, USA
S. Q. Hoyle
Affiliation:
Department of Geosciences and Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802, USA
G. G. Johnson Jr.
Affiliation:
Department of Geosciences and Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802, USA
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Abstract

The use of whole-pattern matching techniques for phase identification provides increased confidence in the phases determined compared with d-I matching and enhances the potential for determining the existence of phases present in low concentrations. Reference patterns from a database of selected phases were compared with the experimental pattern obtained from an unknown, and the results were ranked using figures-of-merit designed to distinguish the best pattern matches. Several different figures-of-merit have been evaluated, all of which proved successful in recognizing the strongest phase but varied with respect to the other phases.

Low-concentration phases are revealed when the patterns of the more abundant phases are stripped from the experimental trace using the best-fit scaled reference traces. Pattern stripping is improved by pattern shifting and profile shape matching which are provided for in the matching program.

Type
VI. Whole Pattern Fitting, Phase Analysis by Diffraction Methods
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 287 - 299
Copyright
Copyright © International Centre for Diffraction Data 1992

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