Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-05T14:00:36.609Z Has data issue: false hasContentIssue false
  • English
  • Français

Phase Identification by X-Ray Powder Diffraction Evaluation of Various Techniques

Published online by Cambridge University Press:  06 March 2019

J. D. Hanawalt
J. D. Hanawalt*
Affiliation:
University of Michigan Ann Arbor, Michigan 48109
Get access

Abstract

Three powder mixtures, each composed of four or more phases, were submitted for phase identification by x-ray diffraction. Laboratory technicians supplied tables of “d” values and of relative intensities as obtained separately and independently by use of the diffractometer, the Debye camera and the Guinier camera. These tables of diffraction data were “solved” by utilization of the Joint Committee search manuals and reference to the Joint Committee Powder Diffraction File (P.D.F.). The same tables of data were then submitted to the 2dTS:Diffraction Data Tele∼Search for a computer printout of results. Experimental data are also presented which provide a quantitative comparison of the accuracy of measurement of “d” values and of the resolution of Debye cameras vs Guinier cameras, since this information is necessary for efficient search procedures whether by manual or computer methods.

Type
X-Ray Powder Diffraction
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 63 - 73
Copyright
Copyright © International Centre for Diffraction Data 1976

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Debye, P. and Scherrer, P., Phys. Z. 17, 277 (1916); 18, 291 (1917).Google Scholar
2. Hull, A. W., Phys. Rev. 10, 661 (1917); J. Am. Chem. Soc, 41, 1169 (1919).Google Scholar
3. Winchell, A. N., Am. Min. 12, 261 (1927).Google Scholar
4. Guinier, A., Acad, C. R.. Sci. 204, 1115 (1937); Ann. Phys. 12, 161 (1939).Google Scholar
5. Hanawalt, J. D., Rinn, H. W., and Frevel, L. K., Ind. Eng. Chem., Anal.Ed. 10, 457 (1938).Google Scholar
6. Boldyrev, A. K., Mikheev, V. I., Dubinina, V. N. and Kovalev, G. A., Ann. Inst. Mines Leningrad 11, 1 (1938).Google Scholar
7. Davey, W. P., J. App. Phys. 10, 820 (1939).Google Scholar
8. DeWolff, P. M., Acta Cryst. 1, 207 (1948).Google Scholar
9. Parrish, W., Am. Min. 33, 770 (1948); X-ray Analysis Papers, Centrex Publ. Co., Eindhoven 1965.Google Scholar
10. Bigelow, W. C. and Smith, J. V., ASTM, S.T.P. 372, 54 (1965).Google Scholar
11. Smith, D. K., Law. Rad. Lab. UCRL-7196 (1963); ibid. UCRL-50264 (1967).Google Scholar
12. Nichols, M. C., UCRL-70078, 19 (1966).Google Scholar
13. Johnson, G. G. and Vand, V., Ind. Eng. Chem. 59, 19 (1967).Google Scholar
14. Frevel, L. K. and Adams, C. E., Anal. Chem. 40, 1335 (1968).Google Scholar
15. Lagrangian Interpolation, Fortran IV, Ingeniorsfirman Instrumenttjanst, Sundbyberg, Sweden (1970).Google Scholar
16. Johnson, G. G., Data Base and Search Programs, J.C.P.D.S. (1974).Google Scholar
17. The Joint Committee on Powder Diffraction Standards, 1601 Park Lane, Svarthmore, Pennsylvania 19081.Google Scholar