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Peritectic Melting Sequence of Bi-2212 and Bi-2212/Ag Measured Using Insitu XRD
Published online by Cambridge University Press: 06 March 2019
Abstract
High temperature X-ray diffraction (HTXRD) was used to determine the peritectic melting sequence of BI2Sr2CaCu2O8 (Bi-2212) and Bi-2212+20 wt.% Ag thick films on MgO substrates. The optimized sample preparation technique includes tape casting the powders to form 10μm thick films, and reducing the residual carbon concentration to 1600 ppm by careful thermal treatment before the HTXRD measurements. Lattice parameter analyses were used to determine the compositions of solid solutions present in the partially-melted state. Pour phases form during melting Bi-2212 or Bi-2212 + Ag, including an unidentified phase, (C0,4Sr0,6CuO2, (Ca1,4Sr0,6)CuO3, and (Sr,Ca)0.
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- Copyright © International Centre for Diffraction Data 1995