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Peritectic Melting Sequence of Bi-2212 and Bi-2212/Ag Measured Using Insitu XRD

Published online by Cambridge University Press:  06 March 2019

S. T. Misture ,
D. P. Mathers ,
R. L. Snyder ,
T. N. Blanton ,
G. M. Zom  and
B. Seebacher
S. T. Misture
Affiliation:
Institute for Ceramic Superconductivity, New York State College of Ceramics at Alfred University, Alfred, NY 14802
D. P. Mathers
Affiliation:
Institute for Ceramic Superconductivity, New York State College of Ceramics at Alfred University, Alfred, NY 14802
R. L. Snyder
Affiliation:
Institute for Ceramic Superconductivity, New York State College of Ceramics at Alfred University, Alfred, NY 14802
T. N. Blanton
Affiliation:
Analytical Technology Division, Eastman Kodak Company, Rochester, NY 14652-3712
G. M. Zom
Affiliation:
Siemens Corporate Research, Otto-Hahn-Ring 6, D-81730 Munich, Germany
B. Seebacher
Affiliation:
Siemens Corporate Research, Otto-Hahn-Ring 6, D-81730 Munich, Germany
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Abstract

High temperature X-ray diffraction (HTXRD) was used to determine the peritectic melting sequence of BI2Sr2CaCu2O8 (Bi-2212) and Bi-2212+20 wt.% Ag thick films on MgO substrates. The optimized sample preparation technique includes tape casting the powders to form 10μm thick films, and reducing the residual carbon concentration to 1600 ppm by careful thermal treatment before the HTXRD measurements. Lattice parameter analyses were used to determine the compositions of solid solutions present in the partially-melted state. Pour phases form during melting Bi-2212 or Bi-2212 + Ag, including an unidentified phase, (C0,4Sr0,6CuO2, (Ca1,4Sr0,6)CuO3, and (Sr,Ca)0.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 723 - 729
Copyright
Copyright © International Centre for Diffraction Data 1995

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