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Performance Of Room-Temperature X-Ray Detectors Made From Mercuric Iodide (HgI2) Platelets

Published online by Cambridge University Press:  06 March 2019

J. B. Barton ,
A. J. Dabrowski ,
J. S. Iwanczyk ,
J. H. Kusmiss ,
G. Ricker ,
J. Vallerga ,
A. Warren ,
M. R. Squillante ,
S. Lis  and
G. Entine
J. B. Barton
Affiliation:
Medical Imaging Science Group, USC, Marina del Rey, CA
A. J. Dabrowski
Affiliation:
Medical Imaging Science Group, USC, Marina del Rey, CA
J. S. Iwanczyk
Affiliation:
Medical Imaging Science Group, USC, Marina del Rey, CA
J. H. Kusmiss
Affiliation:
Medical Imaging Science Group, USC, Marina del Rey, CA
G. Ricker
Affiliation:
Center for Space Research, MIT, Cambridge, MA
J. Vallerga
Affiliation:
Center for Space Research, MIT, Cambridge, MA
A. Warren
Affiliation:
Center for Space Research, MIT, Cambridge, MA
M. R. Squillante
Affiliation:
RMD Inc., Watertown, MA
S. Lis
Affiliation:
RMD Inc., Watertown, MA
G. Entine
Affiliation:
RMD Inc., Watertown, MA
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Abstract

Current developments in the recently introduced method of HgI2 crystal platelet growth by polymer assisted vapor transport are described. Crystal parameters are evaluated by making electrical measurements on x-ray detectors fabricated from HgI2 platelets, Selection for detector fabrication is on the basis of size and apparent crystalline perfection. Detectors have been fabricated with active areas averaging 2 to 3 mm2 and thicknesses ranging from 20 to 400 µm. Values of electron mobility and mobility-lifetime product measured for HgI2 platelet material are among the highest ever observed for HgI2.

The combination of low leakage current and good electron transport makes HgI2 platelets suitable for room-temperature x-ray spectrometry. An energy resolution of 370 eV (FWHM) for the 5.9 KeV Mn Kα line has been obtained, and representative low-energy x-ray fluorescence spectra are presented.

Type
I. XRF Detectors and XRF Instrumentation
Information
Advances in X-Ray Analysis , Volume 25: Thirtieth Annual Conference on Applications of X-ray Analysis, August 3-7, 1981 , 1981 , pp. 31 - 37
Copyright
Copyright © International Centre for Diffraction Data 1981

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References

1. Faile, S. P., Dabrowski, A. J., Huth, G. C., and Iwanczyk, J. S., J. Crystal Growth 50 (1980) 752.Google Scholar
2. Schieber, M., Schnepple, W.F., and Van den Berg, L., J. Crystal Growth 33 (1976) 125.Google Scholar
3. Iwanczyk, J. S., Dabrowski, A. J., Huth, G. C., Del Duca, A., and Schnepple, W., IEEE NS-28, 1 (1981) 579.Google Scholar
4. Iwanczyk, J. S., Kusmiss, J. H., Dabrowski, A. J., Barton, J. B., and Huth, G. C., Fifth Symposium on X- and Gamma-Ray Sources and Applications held at the University of Michigan, Ann Arbor, Michigan, June 10-12, 1981 (proceedings will appear in a special issue of Nuclear Instruments and Methods)Google Scholar
5. Dabrowski, A. J., in Advances in X-Ray Analysis, Volume 25Google Scholar