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Particle Size and Mineralogical Effects in Mining Applications

Published online by Cambridge University Press:  06 March 2019

F. Bernstein*
Affiliation:
General Electric Company Milwaukee, Wisconsin
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Abstract

A relationship is derived between X-ray intensity and particle size for a minor constituent in a powder sample. Theoretical and experimental curves are compared for several elements which are of importance in mining applications. Based upon these curves, some general guides are established relating to a method of predicting the particle size required for a given application. It is also shown that the relative intensity of a minor constituent is independent of the absorption coefficient of the matrix, if the particle size of the matrix is constant. Mineralogical effects, which relate to the occurrence of an element in two or more forms of chemical combination, are discussed and several examples in mining applications are cited.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1962

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References

1. Fonda, G. R., J. Am. Chem. Soc. 55: 123, 1933.Google Scholar
2. Bernstein, F., Advances in X-ray Analysis, Vol. 5, University of Denver, Plenum Press, New York, 1961, pp. 486499.Google Scholar
3. Claisse, F. and Samson, C., Advances in X-ray Analysis, Vol. 5, University of Denver, Plenum Press, New York, 1961, pp. 335354.Google Scholar
4. Smithson, G. L., Eager, R. L., and Van Cleave, A. B., Advances in X-ray Analysis, Vol. 2, University of Denver, Plenum Press, New York, 1958, p. 175.Google Scholar
5. Liebhafsky, H. A., Pfeiffer, H. G., Winslow, E. H., and Zemany, P. D., X-ray Absorption and Emission in Analytical Chemistry, John Wiley & Sons, Inc., New York, 1960, p. 154.Google Scholar
6. Claisse, F., Norelco Reptr. 3: 3, 1957.Google Scholar
7. Campbell, W. J. and Thatcher, J. W., Advances in X-ray Analysis, Vol. 2, University of Denver, Plenum Press, New York, 1958, p. 313.Google Scholar