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Part II-Description of X-Ray Double-Crystal Diffractometer Combining X-Ray Microscopy and Diffraction Analysis

Published online by Cambridge University Press:  06 March 2019

Sigmund Weissman  and
Kenneth A. Turner Jr.
Sigmund Weissman
Affiliation:
College of Engineering, Rutgers University, New Brunswick, N. J.
Kenneth A. Turner Jr.
Affiliation:
College of Engineering, Rutgers University, New Brunswick, N. J.
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Abstract

The following pages are devoted to the description of the instrument by which the method described in Part I can be implemented.

Referring to Figures 1, 2 and 3, numeral 1 designates a collimator through which the primary beam P passes, emerging from an x-ray diffraction tube (not shown). Collimator 1 is fitted with a slit system which is adjusted by adjustment screw 2, controlling thereby the divergence of the x-ray beam. The collimator support 4 is attached to the base plate 5. The height and inclination of the collimator support with respect to the base plate is adjustable, so that the instrument can be adapted to various commercial diffraction units. Locking screw 6 locks the height and locking screw 7 locks the tilt of the collimator support.

Type
Substructure Characteristics of Fine Grained Metals and Alloys Disclosed by X-Ray Microscopy and Diffraction Analysis
Information
Advances in X-Ray Analysis , Volume 2: Seventh Annual Conference on Industrial Applications of X-ray Analysis, August 13-15, 1958 , 1958 , pp. 37 - 45
Copyright
Copyright © International Centre for Diffraction Data 1958

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References

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