Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-23T12:43:42.103Z Has data issue: false hasContentIssue false
  • English
  • Français

A New X-Ray Diffraction Method for Quantitative Multicomponent Analysis

Published online by Cambridge University Press:  06 March 2019

Frank H. Chung
Frank H. Chung*
Affiliation:
Sherwin-Williams Research Center, Chicago, Illinois 60628
Get access

Abstract

A unified matrix-flushing theory and its practical applications for quantitative multicomponent analysis by X-ray diffraction are presented.

In this method, a fundamental “matrix-flushing” concept is introduced; the calibration curve procedure is shunted; the matrix (absorption) effect is totally eliminated; all components, crystalline or amorphous, can be determined.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 17: Twenty-Second Annual Conference on Applications of X-ray Analysis, August 22-24, 1973 , 1973 , pp. 106 - 115
Copyright
Copyright © International Centre for Diffraction Data 1973

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Chung, F. H. and Scott, R. W., “Vacuum Sublimation and Crystallography of Quinacridones”. J. Appl. Cryst. 4, 506–511 (1971)Google Scholar
2. Bunn, C. W., “Chemical Crystallography”, p. 223, Oxford, London (1961)Google Scholar
3. Azaroff, L. V., “Elements of X-Ray Crystallography”, p. 202, McGraw-Hill, New York (1968)Google Scholar
4. Chung, F. H., “Quantitative Interpretation of X-Ray Diffraction Patterns of Mixtures. I. Matrix-Flushing Method for Quantitative Multicomponent Analysis”. J. Appl. Cryst. in press (1973)Google Scholar
5. Chung, F. H., “Quantitative Interpretation of X-Ray Diffraction Patterns of Mixtures. II . Adiabatic Principle of X-Ray Diffraction Analysis of Mixtures”. J. Appl. Cryst. in press (1973)Google Scholar
6. Barry, L. G., Ed., “Inorganic Index to the Powder Diffraction File”, p. 1421, JCPDS (1972)Google Scholar
7. Chung, F. H. and Scott, R. W., “A New Approach to the Determination of Crystallinity of Polymers by X-Ray Diffraction”, J. Appl. Cryst. 6, 225–230 (1973)Google Scholar