Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-23T11:47:50.140Z Has data issue: false hasContentIssue false
  • English
  • Français

New Rotating Anode X-Ray Generator For XAFS Experiments

Published online by Cambridge University Press:  06 March 2019

Kenji Sakurai
Kenji Sakurai*
Affiliation:
National Research Institute for Metals: Tsukuba, Ibaraki 305, Japan Naohisa Osaka, Hitoshi Sakurai, Hajime Izawa Rigaku Corp.: Akishima, Tokyo 100, Japan
Get access

Abstract

A high-power X-ray generator equipped with a lanthanum hexaboride cathode has been developed for X-ray absorption fine structure experiments. A high tube-current of more than 1,000 mA can be provided when operated at low tube-voltage of less than 20 kV. In addition, the focal width is narrow enough (less than 0.1 mm) to ensure good energy resolution. Extremely intense monochromatic X-rays (106 ∼ 107 counts/(sec.mm2) at the sample position), which are completely free from higher order harmonics and tungsten contamination lines, are available, when a Johansson-type spectrometer is employed. The filament life has been significantly prolonged by the high vacuum specification of the tube.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 149 - 153
Copyright
Copyright © International Centre for Diffraction Data 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Sayer, D. E., Lytle, F. W. and Stern, E. A., Adv. in X-Ray Anal. 13:248 (1970).Google Scholar
2. Lee, P. A., Citrin, P. H., Eisenberger, P. and Kincaid, B. M., Rev, of Mod. Phys. 53:769 (1981).Google Scholar
3. Koningsberger, D. C. and Prins, R. Ed., “X-Ray Absorption”, John Wiley & Sons, New York, (1988).Google Scholar
4. Lytle, F. W., Sayers, D. E., and Stern, E. A., Phys. Rev. B11:4825 (1975).Google Scholar
5. Knapp, G. S., Chen, H., and Klippert, T. E., Rev. Sci. Instrum. 49:1658 (1978);Google Scholar
Georgopouios, P. and Knapp, G. S., J. Appl. Cryst. 14:3 (1981).Google Scholar
6. Stern, E. A. ed., “Laboratory EXAFS Facilities - 1980”, AIP Conf. Proc. No. 64. American Institute of Physics, New York, (1981).Google Scholar
7. Khalid, S., Emrich, R., Dujari, R., Shults, J., and Katzer, J. R., Rev. Sci. Instrum. 53:22 (1982).Google Scholar
8. Williams, A., Rev. Sci. Instrum. 54:193 (1983).Google Scholar
9. Thulke, W., Haensel, R. and Rabe, P., Rev. Sci. Instrum. 54:277 (1983).Google Scholar
10. Tohji, K., Udagawa, Y., Kawasaki, T. and Masuda, K., Rev. Sci. Instrum., 54, 1482 (1983);Google Scholar
Tohji, K., Udagawa, Y., Kawasaki, T. and Mineo, A., Rev. Sci. Instrum. 59:1127 (1988).Google Scholar
11. Georgopouios, P. and Tang, C. H., Adv. in X-Rav Anal. 27:299 (1984).Google Scholar
12. Yacoby, Y., Brettschneider, M. and Bezalel, M., Rev. Sci. Instrum. 58:588 (1987).Google Scholar
13. Sakurai, K., Rev. Sci. Instrum. 64:267 (1993);Google Scholar
Sakurai, K. and Sakurai, H., Rev. Sci. Instrum. 64:2702 (1993),Google Scholar
Sakurai, K. and Sakurai, H., Rev. Sci. Instrum. 65:2417 (1995).Google Scholar
14. Sakurai, K., Jpn. J. Appl, Phys. Suppl. 32-2:261 (1993).Google Scholar
15. Sakurai, K. and Sakurai, H., Rigaku Journal 12:41 (1995).Google Scholar
16. LafFerty, J. M., J. Appl. Phys. 22:299 (1951); Broers, A. N., J. Appl, Phys. 38:1991, 3040 (1967).Google Scholar
17. Gallagher, H. E., J. Appl. Phvs. 40:44 (1969).Google Scholar
18. for example, Yao, T.. Rev. Sci. Instrum. 63:2103 (1992).Google Scholar
19. Williams, M. D., Jackson, L. T., Kippenhan, D. O., Leung, K. N. and West, M. K., Appl. Phys. Lett. 50:1844(1987).Google Scholar
20. Sakurai, K., Mori, M. and Mizutani, U., Phvs. Rev. B 46:5711 (1992).Google Scholar