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A New Position Sensitive Detector for X-Ray Diffractometry

Published online by Cambridge University Press:  06 March 2019

J. L. Radtke  and
D. W. Beard
J. L. Radtke
Affiliation:
Reflection Imaging, Inc., Madison, WI 53705
D. W. Beard
Affiliation:
Reflection Imaging, Inc., Madison, WI 53705
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Abstract

Position sensitive detectors provide efficient X-ray detection over large solid angles; this capability has revolutionized X-ray diffractometry by reducing data collection time. This paper describes testing of a new single-axis position sensitive detector designed to locate 0.6-2 Angstrom X-rays. Dead time, quantum efficiency, energy resolution, and spatial resolution were measured. Standard powder diffraction patterns were observed with the detector, and data sets are presented. The impact of detector performance parameters on diffraction experiments is discussed.

Type
X. XRD Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 617 - 622
Copyright
Copyright © International Centre for Diffraction Data 1992

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References

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