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New Improvements in Routine Quantitative Phase Analysis by X-Ray Diffractometry

Published online by Cambridge University Press:  06 March 2019

J.J. Sahores
J.J. Sahores*
Affiliation:
Société Nationale des Pétroles d'Aquitaine, 64001 Pau, France
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Abstract

The principle of the method that we proposed two years ago (1) to correct the matrix effects in quantitative diffractometry is briefly recalled and recent improvements are described. Some examples taken in geological field illustrate its possibilities.

A new field of application has been explored : thanks to a combination of this method with background measurement, a semi-quantitative estimation of the amount of amorphous material is made possible in any sample.

This correction technique can be used with any regular diffractometer : for this purpose we simply need to add a second measuring channel, the characteristics of which are given.

Finally we describe briefly the complementary electronics which have been designed in order to fully automate the apparatus, from the insertion of the samples to the printing of the results.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 16: 'Twenty-First Annual Conference on Applications of X-ray Analysis, August 2-4, 1972 , 1972 , pp. 186 - 197
Copyright
Copyright © International Centre for Diffraction Data 1972

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References

1. Sahores, J.J.. “Emploi du rayonnement diffuseé Compton en diffractométrie X comme correcteur des erreurs dues à l'absorption”, 30 ème Congrès du G.A.M.S., Paris (1970).Google Scholar
2. Reynolds, R.C.. “Matrix corrections in trace element analysis by X-Ray Fluorescence ; estimation of the mass absorptton coefficient by Compton scattering”. Amer. Mineral. 48, 1133–1143 (1963).Google Scholar
3. Sahores, J.J., Ducasse, H.M. and Desjardins, M.. “Amélioration du dosage de Série en diffractométrie X : correction des effets d'absorption, par mesure Compton ; dépouillement des diffractograrames par ordinateur”. 2ème Colloque International sur les Rayonnements X, Toulouse (1971).Google Scholar
4. Ducasse, H.M.. “Dispositif de ménorisation d'informations obtenues sous forme d'une grandeur électrique. Rapport interne SPI 820, S.N.P.A. (1968).Google Scholar
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