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New Directions in the X-Ray Diffraction Analysis of Organic Materials

Published online by Cambridge University Press:  06 March 2019

Ron Jenkins
Ron Jenkins*
Affiliation:
International Centre for Diffraction Data Swarthmore, PA, USA
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Abstract

The analysis of crystalline organic phases by X-ray powder diffraction presents special problems, beyond those typically associated with inorganic materials. The large unit cells often associated with organic compounds, combined with the low symmetry of the structures, give rather complicated diffraction patterns which contain many low angle lines. The Bragg-Brentano geometric arrangement employed in most commercial diffractometers gives maximum d-spacing error at low diffraction angles. This, in turn, means that not only can the large d-spacing data be of poor quality, but also that much of the low angle data required for the indexing of the pattern is subject to large errors.

Type
IX. XRD Applications: Detection Levitts, Superconductors, Organics, Minerals
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 653 - 660
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

[1] Parrish, W. and Lowitzsch, K., American Mineralogist, 44 (1959) 765–787 Google Scholar
[2] Schreiner, W.N. and Jenkins, R., Adv. X-ray Anal., 32 (1989) 557–560 Google Scholar
[3] Jenkins, R. and Schreiner, W.N., Powder Diffraction, 4 (1989) 74–100 Google Scholar
[4] Jenkins, R. and Nicolosi, J.A, “Long wavelength X-ray diffractometer“; Patent Application North American Philips Corp., USA 815349, 87/07/15Google Scholar
[5] Jenkins, R. and Paolini, F.R., Norelco reporter, 21 (1974) 9–16 Google Scholar
[6] Post, B., “Laboratory hints for crystallographers, Norelco Reporter, 20 (1973) 8–11 Google Scholar
[7] Powder Diffraction File - Alphabetic Indexes, produced annually by the International Centre for Diffraction Data, 1601 Park Lane, Swarthmore PA 19081, USAGoogle Scholar
[8] Hanawalt, J.D., Rinn, H.W. and Frevel, L., Ind. Eng. Chem.(Anal. Ed.), 10 (1938) 457 Google Scholar
[9] Bigelow, W. and Smith, J.V., ASTM Special Technical Publication STP 372 (1965) 54 Google Scholar
[10] Jenkins, R and Holomany, M, Powder Diffraction, 2 (1987) 215–219 Google Scholar
[11] Harry Thielke has been a long time member of the ICDD Organic Subcommittee. Previously employed by E.I duPont de Nemours & Co. Mr. Thielke is now retired.Google Scholar
[12] The ICDD Grants-in-Aid program is primarily designed to give financial support to those organizations producing new X-ray powder data. Further information about the program can be obtained by writing to the General Manager, JCPDS-ICDD, 1601 Park Lane, Swarthmore PA 19081, USA.Google Scholar